Pre-thinning device for metal samples and pre-thinning method for metal samples
A metal and sample technology, which is applied in the field of cheap and environmentally friendly pre-thinning devices, can solve the problems of difficulty in unfixing, difficulty in clamping, etc.
Active Publication Date: 2020-04-10
YANGZHOU UNIV
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Problems solved by technology
[0007] The purpose of the present invention is to provide a cheap and environmentally friendly pre-thinning device and method for manually preparing metal samples for transmission electron microscopy (TEM) in a 3D printing material laboratory. The present invention is used to solve the clamping difficulties and Difficult to remove the problem of fixation, the thinning method of TEM metal sample provided by the present invention can make the sample to be thinned be convenient to clamp while thinning the metal sample, reduce the possibility of dismantling the metal flake fragmentation, the metal sample flat surface
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[0042] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0043] The method of preparing metal samples for transmission electron microscopy by using a pre-thinning device:
[0044] Step 1: Use a 3D printer to make a base with PLA material] and make enough replacement parts according to the thickness that needs to be thinned. Production requirements such as Figures 1a-3b As shown: there is a water injection hole 1 in the center of the top of the base body, a water storage tank 2 is opened inside the base body, the bottom of the water storage tank 2 has a convex curved surface, four circular water outlet holes 3 are opened at the bottom of the base body, and there are four columns on the side of the base body bottom Shaped clip 4; there is a Z-shaped groove 5 on the inner side of the replacement part, and four centrally symmetrical special-shaped water outlet holes 6 are opened on the bottom...
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The invention relates to the technical field of transmission electron microscope (TEM) sample thinning. Pre-thinning setup for metal samples, consisting of mating substrates and replacement parts. The pre-thinning method is as follows: cleaning and drying the metal sheet to be thinned, and attaching the lower bottom surface of the replacement part to the opposite side of the metal to be thinned; twisting the combination of the replacement part and the metal sheet to the substrate , after injecting water through the through hole of the base body, use the friction mechanism that moves relative to the metal sheet to thin the surface to be thinned of the metal sheet; after every 0.05±0.02mm of thinning, remove the combination of the replacement part and the metal sheet and heat it Melt at 200±20°C; select a new replacement part, use the opposite side of the metal sheet to be thinned as the new thinned surface, and repeat the above steps until the thickness is less than or equal to 0.05mm. The TEM metal sample thinning method provided by the invention can make the thinned sample easy to clamp while thinning the metal sample, reduce the possibility of dismantling the metal flakes, and make the surface of the metal sample smooth.
Description
technical field [0001] The invention relates to the technical field of transmission electron microscope (TEM) sample thinning, in particular to a cheap and environmentally friendly pre-thinning device and method for manually preparing transmission electron microscope (TEM) metal samples in a 3D printing material laboratory. Background technique [0002] Transmission Electron Microscope (TEM), referred to as TEM, projects an accelerated and concentrated electron beam onto a very thin sample, and the electrons collide with the atoms in the sample to change their direction, thereby producing solid angle scattering. The size of the scattering angle is related to the density and thickness of the sample, so images with different light and dark can be formed. Usually, the resolution of the transmission electron microscope is 0.1-0.2nm, and the magnification is tens of thousands to millions of times. microstructure". Transmission electron microscopy is widely used in materials sci...
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IPC IPC(8): B24B7/10B24B55/02G01N23/04
CPCB24B7/10B24B55/02G01N23/04
Inventor 刘澄周文韬梁中阳王璇崔锡锡杨晨周睿
Owner YANGZHOU UNIV