Three-dimensional surface shape measurement device and method for mirror object based on infrared stripes

A measuring device and three-dimensional surface shape technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of visible light interference and affecting measurement results, and achieve the effect of ingenious design, improved collection efficiency, and high collection efficiency

Active Publication Date: 2018-12-21
HEBEI UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, the existing measurement methods for specular objects use visible light, which is easily disturbed by external ambient light and affects the final measurement results.

Method used

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  • Three-dimensional surface shape measurement device and method for mirror object based on infrared stripes
  • Three-dimensional surface shape measurement device and method for mirror object based on infrared stripes
  • Three-dimensional surface shape measurement device and method for mirror object based on infrared stripes

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Embodiment Construction

[0035] Specific examples of the present invention are given below. The specific embodiments are only used to further describe the present invention in detail, and do not limit the protection scope of the claims of the present application.

[0036] The invention provides a device for measuring the three-dimensional surface shape of a specular object based on infrared stripes (referred to as the device, see figure 1 ), characterized in that the device includes a computer 1, an infrared projector 2, a CCD infrared camera 3, a mirror object to be measured 4, a frosted glass 5, a reflector 6 with a ring mark on the surface, a first high-precision horizontal moving guide rail 7, Fixed plate 8 and the second high-precision horizontal moving guide rail 9; the computer 1 is connected with infrared projector 2, CCD infrared camera 3, the first high-precision horizontal moving guide rail 7 and the second high-precision horizontal moving guide rail 9 respectively, and the computer 1 It i...

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PUM

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Abstract

The invention discloses a three-dimensional surface shape measurement device and method for a mirror object based on infrared stripes. The device comprises a computer, an infrared projector, a CCD infrared camera, a to-be-measured mirror object, frosted glass, a reflecting mirror with a circular mark on the surface, a first high-precision horizontal moving guide rail, a fixed plate and a second high-precision horizontal moving guide rail. The method comprises the following specific steps: preliminarily constructing a measurement device: 1) preliminarily constructing the measurement device; 2)calibrating the measurement device; 3) completing construction of the measurement device; 4) collecting stripe information of two positions; 5) solving three-dimensional shape depth information of themirror object, so as to complete three-dimensional shape measurement of the mirror object.

Description

technical field [0001] The invention relates to the field of three-dimensional surface shape measurement of mirror surfaces and highly reflective objects, in particular to a device and method for three-dimensional surface shape measurement of mirror objects based on infrared stripes. Background technique [0002] With the advent of the information age, the three-dimensional shape information of objects plays an increasingly important role in various industries. Especially in precision manufacturing, automobile industry, aerospace and other fields, the rapid and accurate acquisition of three-dimensional shape information of objects has increasingly become a hot and difficult point of people's attention and research. In recent years, Optical Three-Dimensional Measurement Techniques (Optical Three-Dimensional Measurement Techniques) has been widely used in industrial inspection, manufacturing, medical industry, aerospace and other fields due to its non-contact, high precision, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 张宗华常彩霞高楠
Owner HEBEI UNIV OF TECH
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