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LVDS/V-by-one signal test fixture for core main board

A v-by-one, signal testing technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of low test efficiency, signal interference, etc.

Inactive Publication Date: 2019-01-01
TCL KING ELECTRICAL APPLIANCES HUIZHOU
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to provide a LVDS / V-by-one signal test fixture for the main board of the core, aiming to solve the problems of signal interference and low test efficiency in the existing test fixtures

Method used

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  • LVDS/V-by-one signal test fixture for core main board
  • LVDS/V-by-one signal test fixture for core main board
  • LVDS/V-by-one signal test fixture for core main board

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Embodiment Construction

[0022] The technical solutions in this embodiment will be clearly and completely described below in conjunction with the accompanying drawings in this embodiment. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0023] It should be noted that all directional indications (such as up, down, left, right, front, back...) in this embodiment are only used to explain the relative relationship between the various components in a certain posture (as shown in the figure). When the positional relationship, movement conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0024] In addition, in the present invention, descriptions such as "first", "second" and so on are ...

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Abstract

The invention discloses an LVDS / V-by-one signal test fixture for a core main board. The test fixture comprises a rack for installing a core main board. In addition, the test fixture also includes testpins, a signal switching assembly and a signal connecting line connected with the signal switching assembly. The signal switching assembly is used for outputting an LVDS / V-by-one signal, measured bythe test pin, of the core main board to the signal connecting line and includes a switching base; pin holes matching and corresponding to the test pins are formed in the switching base; one end of each test pine is in butt joint with an LVDS / V-by-one signal testing point arranged on the core main board and the other end of the test pin is inserted into one pin hole. The LVDS / V-by-one signal test fixture has advantages of good anti-interference performance and high test efficiency.

Description

technical field [0001] The invention relates to the technical field of circuit board testing equipment, in particular to a LVDS / V-by-one signal testing fixture for a core main board. Background technique [0002] The transmission rate of the LVDS / (or) V-by-one signal of the main board of the movement is quite high, especially the transmission rate of the V-by-one signal is as high as 1G bps or more. Existing test fixtures usually use welding wires to test the LVDS / V-by-one signal of the main board of the movement, or use the method of manually inserting the signal connection line on the main board of the movement, that is, manually inserting the signal connection line The way to test the LVDS / V-by-one signal of the main board of the movement. Among them, the method of welding wires is prone to signal interference, which makes the collected image signals unable to be restored, resulting in test failure, and the method of manually plugging signal connection lines has the prob...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2832
Inventor 梁炎文李业生
Owner TCL KING ELECTRICAL APPLIANCES HUIZHOU
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