Stimulated emission loss super-resolution microscope for realizing rapid beam combination

A technology of stimulated emission loss and super-resolution, which is used in microscopes, material analysis by optical means, optics, etc., can solve the problems of reduced super-resolution imaging effect, no longer accurate coincidence of light spots, disappearance, etc., and achieve good super-resolution imaging. effect of effect

Active Publication Date: 2019-01-11
SUZHOU GUOKE MEDICAL TECH DEV CO LTD +1
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Problems solved by technology

[0003] In STED imaging, it is necessary to precisely combine the excitation light and the loss light, so that the spots of the two beams after being focused by the objective lens can be precisely overlapped. The position of the spot is easy to drift, so that the two spots no longer coincide precisely, so that the effect of super-resolution imaging decreases or disappears completely

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  • Stimulated emission loss super-resolution microscope for realizing rapid beam combination
  • Stimulated emission loss super-resolution microscope for realizing rapid beam combination
  • Stimulated emission loss super-resolution microscope for realizing rapid beam combination

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[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] see figure 1 , is a schematic structural diagram of a stimulated emission depletion super-resolution microscope for realizing rapid beam combining provided by an embodiment of the present invention, including: a STED imaging unit 100 and a beam combining test unit 200 . in:

[0027] The STED imaging unit 100 includes: a first laser 10, a first mirror 11, a second laser 12, a phase plate 13, a first dichromatic mirror 14, a λ / 4 slide 15, a second mirror...

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Abstract

The invention provides a stimulated emission loss super-resolution microscope for realizing rapid beam convergence. The stimulated emission loss super-resolution microscope comprises: an STED imagingunit and a beam combination test unit. Accurate beam combination is performed on exciting light and loss light by the beam combination test unit, so that the two beams can accurately coincide throughthe imaging spots of the STED imaging unit to obtain a better super-resolution imaging effect.

Description

technical field [0001] The invention relates to the technical field of micro-optical imaging, in particular to a stimulated emission loss super-resolution microscope. Background technique [0002] The imaging resolution of optical super-resolution microscopy exceeds the limit of optical diffraction, and its imaging resolution is much higher than that of traditional optical microscopy. It is a research hotspot in recent years, and many types have emerged. Stimulated Emission Depletion (STED) microscopy is the far-field optical microscopy that was first proposed and directly overcomes the optical diffraction limit. It is based on laser confocal microscopy imaging. Compared with other types of super-resolution microscopy Microsurgery, with relatively fast imaging speed, can image living cells and detect finer structures in biomedical research. [0003] In STED imaging, it is necessary to precisely combine the excitation light and the loss light, so that the spots of the two be...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/00G02B21/06
CPCG02B21/0032G02B21/0048G02B21/0076G02B21/008G02B21/06G02B21/0072G01N21/6458
Inventor 张运海昌剑杨皓旻魏通达季林
Owner SUZHOU GUOKE MEDICAL TECH DEV CO LTD
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