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A structure design method of X-ray broad-spectrum three-layer film mirror

A technology of structural design and reflector, which is applied in the structural design field of X-ray wide-spectrum three-layer film reflector, can solve problems such as the reduction of integral reflectivity and the influence of the effective light-gathering area of ​​the telescope, and achieve stable chemical properties and increase the effective light-gathering area. Light area, the effect of increasing the effective light-collecting area

Active Publication Date: 2020-10-02
TONGJI UNIV
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Problems solved by technology

However, with the increase of the critical angle of total reflection, the absorption of heavy metal materials for the relatively low energy range (1-6keV) becomes larger, which reduces the integrated reflectivity of this energy range, and finally causes serious damage to the effective light-collecting area of ​​the telescope. Impact

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  • A structure design method of X-ray broad-spectrum three-layer film mirror
  • A structure design method of X-ray broad-spectrum three-layer film mirror
  • A structure design method of X-ray broad-spectrum three-layer film mirror

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Embodiment Construction

[0043] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. This embodiment is carried out on the premise of the technical solution of the present invention, and detailed implementation and specific operation process are given, but the protection scope of the present invention is not limited to the following embodiments.

[0044] This embodiment provides an X-ray broad-spectrum three-layer film reflector structure, such as figure 1 As shown, it includes a substrate 1, a high-density layer 2, a middle-density layer 3 and a low-density layer 4 arranged in sequence from bottom to top. At the middle position of the reflection critical angle, the thicknesses of the high-density layer 2 , the middle-density layer 3 and the low-density layer 4 are set so that the mirror structure can obtain the highest integrated reflectance in the target energy spectral range.

[0045] Such as figure 2 As shown, the above-...

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Abstract

The invention relates to an X ray wide spectrum three-layer film reflector structure design method. The three-layer film reflector structure comprises a substrate, a high density layer, a middle density layer and a low density layer orderly arranged from bottom to top, and the design method comprises the following steps: a material selection step: according to application environment of a reflector and an incident spectrum energy range with a weight factor, determining materials of the high density layer, the middle density layer and the low density layer; a thickness setting step: according to a grazing incidence angle of the X ray, building an evaluation function through taking that integrated reflectivity is highest in a target energy spectrum range as an optimization goal, and obtaining thickness of the high density layer, the middle thickness layer and the low density layer. Compared with the prior art, the reflector structure designed by the method provided by the invention is simple and easy to prepare, can realize relatively higher integrated reflectivity area and can effectively increase effective light gathering acreage of a telescope.

Description

technical field [0001] The invention relates to the technical field of optical thin films, relates to a reflector structure of an X-ray astronomical telescope, and in particular to a structure design method of an X-ray wide-spectrum three-layer film reflector. Background technique [0002] In the field of X-ray astronomy, X-ray imaging telescopes have very important applications in astronomical observations. The two most important factors in evaluating a telescope's performance are angular resolution and effective light-collecting area. The expression of the effective light-collecting area is [0003] [0004] Among them, r N is the semi-diameter of the Nth layer of the telescope, L P Main mirror length, θ N is the grazing incidence angle of the Nth layer, and R is the reflectivity of the mirror. It can be seen from formula (1) that the improvement of the effective light-collecting area can be achieved by increasing the number of nested layers of the telescope and in...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B5/08
CPCG02B5/085
Inventor 王占山黄秋实杨洋张众
Owner TONGJI UNIV