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Three-dimensional measurement method based on improved multi-frequency stripe structured light

A three-dimensional measurement, structured light technology, applied in the field of optical detection, can solve problems such as weak anti-interference ability

Active Publication Date: 2019-03-19
胡海兵
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  • Abstract
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Problems solved by technology

This method uses Gray code plus phase shift method for unwrapping. When the phase shift fringes are dense, multiple pictures are required to determine the order of fringes for unambiguous expansion, which is vulnerable to ambient light and the reflectivity of the surface of the measured object. Affected by other factors, the anti-interference ability is weak;

Method used

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  • Three-dimensional measurement method based on improved multi-frequency stripe structured light
  • Three-dimensional measurement method based on improved multi-frequency stripe structured light
  • Three-dimensional measurement method based on improved multi-frequency stripe structured light

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Embodiment 1

[0066] refer to figure 2 , a three-dimensional measurement method based on improved multi-frequency fringe structured light, including the following steps:

[0067] 1) Generate coded stripe pictures: combine projector 1 and camera 2 as figure 2 Placement in the manner shown, wherein the projector 1 and the camera 2 are connected to the computer 3 and controlled by the computer 3, the optical axis of the lens of the projector 1 and the optical axis of the lens of the camera 2 intersect at the center of the object 4 to be measured, according to the object to be measured Adjust the distance and angle between camera 2 and projector 1, and use computer 3 to generate coded fringe patterns of various frequencies, such as Figure 4 As shown, the light intensity distribution function of the coded fringe pattern can be expressed as formula (1), wherein, I(x, y) represents the light intensity of the coded fringe pattern, A(x, y) represents the background light intensity of the image, ...

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Abstract

The invention discloses a three-dimensional measurement method based on improved multi-frequency stripe structured light. The method is characterized by comprising the following steps of 1, generatingmulti-frequency coded stripe images; 2, conducting camera calibration; 3, conducting projector calibration; 4, projecting the coded stripe images and calculating an absolute phase of a stripe image the frequency of which is fn; 5, conducting three-dimensional reconstruction measurement. According to the method, applied equipment is simple, the cost is low, and precise three-dimensional measurement can be carried out on the surfaces of large objects complex in profile and drastic in transition.

Description

technical field [0001] The invention belongs to the field of optical detection and relates to three-dimensional measurement of surface structured light, in particular to a three-dimensional measurement method based on improved multi-frequency fringe structured light. Background technique [0002] The continuous advancement of science and technology has gradually increased people's requirements for obtaining object information, and began to change from two-dimensional to three-dimensional. Quickly and accurately obtaining three-dimensional information of objects has become an important task for rapid product design, product quality inspection, medical inspection, and cultural relics protection. , clothing design, automatic navigation and virtual reality systems and other key issues in the neighborhood. The rapid development of optical measurement technology and computer technology has gradually transformed the traditional three-coordinate contact measurement method into an op...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/25
Inventor 朱勇建黄振马俊飞罗坚郭磊潘敏玲
Owner 胡海兵
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