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7 results about "Projector calibration" patented technology

Dynamic projection interactive calibration method and system for annular science magic space

The invention discloses a dynamic projection interaction calibration method and system for an annular science magic space, and belongs to the technical field of projection interaction. The method comprises the steps of obtaining three-dimensional point cloud data of an annular wall surface and spatial pose information of each projector, constructing a wall surface point cloud model, completing projector calibration according to the wall surface point cloud model, and obtaining a pose parameter data set; and based on the data set, mapping each frame of pixel of a preset picture sequence to a corresponding position of the wall surface in real time. And if user interaction is detected, determining an interaction area and executing corresponding logic. In the process, projection feedback images are continuously collected, dynamic calibration and tiny compensation are carried out in combination with pose parameters, calibration projection coordinates and real-time interaction response data are generated, and accordingly, all projectors are controlled to complete real-time and stable projection display on the annular wall surface. According to the scheme, the projection picture is highly consistent with the annular wall surface and user operation, dynamic calibration and real-time interaction are realized, the display precision and stability of projection are improved, and the immersion experience of a user is enhanced.
Owner:ZHONGBIN WENTOU (TIANJIN) TECHNOLOGY CO LTD

Laser demarcation device calibration system and method

The invention discloses a laser demarcation device calibration system and method, and belongs to the technical field of laser demarcation device calibration, the laser demarcation device calibration system comprises a standard horizontal line camera group, a standard contour line camera group, a standard plumb line camera group and a four-dimensional workbench, the standard horizontal line camera group comprises a third CCD camera and a sixth CCD camera, the standard contour line camera group comprises a first CCD camera and a fourth CCD camera, the standard plumb line camera group comprises a second CCD camera and a fifth CCD camera, the first CCD camera, the third CCD camera, the fourth CCD camera and the sixth CCD camera are located in the same horizontal plane, and the second CCD camera, the fourth CCD camera and the fifth CCD camera are located on the same plumb line; the four-dimensional workbench comprises a base table, a height lifting assembly, a two-dimensional inclination assembly, a rotation assembly and a pentaprism. According to the invention, not only is the measurement accuracy of the laser demarcation device improved, but also the calibration work efficiency of the laser demarcation device is improved.
Owner:JIANGSU INST OF METROLOGY

A projector ranging tof calibration workbench

The utility model discloses a kind of projector ranging TOF calibration workbench, belong to projector calibration equipment technical field, including support frame and fixed in the light shield shell of support frame surface, the inner wall of the light shield shell is provided with light-absorbing layer, the bottom wall of the inner chamber of the light shield shell is equipped with mounting groove, and linear reciprocating motor is installed in mounting groove, the driving end of the linear reciprocating motor is installed with jig base, the side outer wall of the jig base is installed with stepper motor, the output of the stepper motor is fixed with support seat, projector main body is placed on the surface of the support seat, and the surface of support seat movably connects two clamping plates for clamping projector main body, moving groove is equipped on the bottom plate of the light shield shell, and operating door is movably connected in moving groove. The projector ranging TOF calibration workbench can efficiently complete the accurate calibration of TOF board, improve the projection accuracy of projector, and is convenient to operate, suitable for industrial production line scene.
Owner:ANHUI YISHU OPTOELECTRONICS TECH CO LTD

Calibration and measurement method and system based on binocular auxiliary single-objective telecentric structured light system

The invention belongs to the technical field of optical system precision detection, and particularly relates to a binocular-assisted single-objective telecentric structured light system calibration and measurement method and system. The method comprises the following steps: obtaining a phase difference value and a height difference value of a reference plane based on a measurement system, fitting a mapping relation between the phase difference value and the height difference value, and realizing calibration from phases to heights of two monocular targets; and converting the phase value of the to-be-measured object into a height value and a point cloud coordinate based on the fitted mapping relation between the phase difference value and the height difference value, and realizing three-dimensional reconstruction and measurement of the to-be-measured object through point cloud splicing. According to the method, the symbol ambiguity problem of a monocular camera lens calibration method is solved, meanwhile, the precision and efficiency problems brought by a traditional projector calibration method are avoided, the phase matching link of an object is avoided, and therefore the problems of matching errors and information loss caused by phase matching under the shielding condition are effectively solved.
Owner:NANKAI UNIV +1

Three-dimensional reconstruction method and 3D structured light machine

The application discloses a kind of three-dimensional reconstruction method and 3D structure light, it is related to three-dimensional reconstruction technical field, it is difficult to obtain accurate circle point edge in circle point calibration process, resulting in the technical problem that three-dimensional reconstruction effect is not ideal.The method includes S1, using the circle point calibration method based on ENet model to carry out camera calibration, obtains camera internal and external parameters;S2, using 16 step phase shift method to carry out projector calibration, obtains the internal and external parameters of projector;Wherein, using the grating compensation algorithm based on binary stripe to carry out grating compensation in projection process;S3, according to the internal and external parameters of the camera, projector, the conversion relationship of image pixel coordinate system and world coordinate system is established, according to the conversion relationship obtains the three-dimensional coordinate information of target object, completes three-dimensional reconstruction.The application extracts accurate circle point edge by establishing ENet model, greatly improves the accuracy of three-dimensional reconstruction.
Owner:XIANGXI INTELLIGENT TECHNOLOGY (CHONGQING) CO LTD

High-precision structured light three-dimensional measurement and calibration method suitable for single-axis MEMS projector

The invention discloses a high-precision structured light three-dimensional measurement and calibration method suitable for a single-axis MEMS projector. Firstly, an MEMS coordinate system is established for an MEMS mirror, a simple constraint relation of a three-dimensional point in the MEMS coordinate system (MCS) is obtained, and then a simple triangular stereo method expression is obtained to recover three-dimensional information. In addition, a simple and efficient MEMS galvanometer calibration method is provided on the basis of MCS, model calibration is completed only through a checkerboard image at one position, the calibration process is greatly simplified, a three-dimensional measurement method convenient to transplant, an innovative calibration method suitable for a single-axis MEMS galvanometer and an efficient MEMS galvanometer projector calibration method are achieved, and the calibration efficiency is greatly improved. Compared with the prior art, the method has the advantages that the measurement accuracy and stability are improved, the system cost and complexity are reduced, the overall complexity and implementation cost of the system are effectively reduced, the MEMS projector can be widely applied to various application scenes, and the method is particularly suitable for measurement tasks needing miniaturization, low cost and high frequency.
Owner:INST OF WENZHOU ZHEJIANG UNIV +1

Projector correction method and system

This invention provides a projector calibration method and system. The projector includes a collimating element and a diffractive optical element. The calibration method includes the following steps: aligning the central axis of the camera with the central axis of the collimating element placed on a fixture; identifying the pose difference between the collimating element and the diffractive optical element, and performing rotational correction based on the pose difference; selecting a pattern in a first region for defocus testing to obtain the optimal position of the vertical distance between the collimating element and the diffractive optical element, and making corresponding position adjustments; comparing the sharpness of the four corners of the obtained pattern in the first region, and performing tilt correction based on the comparison results; obtaining the position coordinates of the optical center point based on the center point coordinates of the feature points of the region pattern; and performing translational correction on the collimating element and the diffractive optical element based on the obtained center point position coordinates, so that the center point coordinates coincide with the camera center point. This invention achieves automatic calibration, which can improve the calibration accuracy and quality of the projector.
Owner:YUYAO SUNNY OPTICAL INTELLIGENCE TECH CO LTD