Rapid projector system parameter calibration method

A technology of system parameters and calibration methods, applied in image data processing, instruments, calculations, etc.

Inactive Publication Date: 2015-08-12
CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
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  • Application Information

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Problems solved by technology

However, for the calibration of the projector system, there is still no mature algorithm that can effectively an

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  • Rapid projector system parameter calibration method
  • Rapid projector system parameter calibration method

Examples

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Embodiment 1

[0086] In this embodiment, the calibration of the projector-camera system requires a projector, a camera, and a calibration board to run a computer system for system calibration calculation. We use the Logitech Pro 9000 camera as the acquisition tool for projected feature patterns and structured light acquisition in the geometric correction of the projected image, and calculate the system calibration parameters of the Lenovo T151DLP projector. The calibration board selects the "checkerboard grid" with 7x 9 numbers and 28mm x 28mm side length. "Characteristic map (such as Figure 4 ) Paste on the wall, use the projector to project the same original picture onto the same wall.

[0087] Similar to the calculation of the calibration parameters of a single camera, the calibration calculation of the projector-camera system also requires the collection of a large number of different projection system postures. First, the projection pattern is projected on the wall surface of the calibra...

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Abstract

The invention discloses a rapid projector system parameter calibration method. The rapid projector system parameter calibration method comprises that 1) camera calibration parameters are calculated by means of a Zhengyou Zhang camera calibration method; 2) a plane equality of the plane where a calibration board is arranged in a camera coordinate space is calculated; 3) a projector projects a projection calibration feature image on the plane where the calibration board is arranged, a camera captures the projection calibration feature image, and the three-dimensional coordinate of the projection calibration feature image is calculated by means of a crossing algorithm of projection light beams and the calibration plane; 4) internal calibration parameters of the projector are calculated by means of an optimized least square method, and therefore a coordinate mapping relation among the camera imaging space, the space where the projection display surface is arranged and the projector projection image space is calculated. According to the invention, by means of the crossing principle of the projection light beams and the calibration plane, the camera calibration and the projector calibration can be calculated in unified manner, and a rapid system calibration method which has robustness is provided for the calibration calculation of internal parameters and external parameters of the projector.

Description

Technical field [0001] The invention relates to a fidelity projection in the field of scientific research and education (scientific visualization), various simulation fields (virtual reality), entertainment and conferences (ubiquitous computing environment, textured wall corners and other complex indoor backgrounds), and meteorology Fast system parameter calibration method of projector equipment in the field of large-screen traffic monitoring and display. Background technique [0002] The projector does not have the image capture capability similar to a camera, and cannot directly obtain the projected image projected on the display surface. Therefore, it cannot directly calculate the pixel coordinates of the two-dimensional projection space and the three-dimensional pixel coordinates in the world coordinate system through the pixel correspondence of different image spaces. Correspondence. Since the relative space conversion between the plane space of the projected calibration fe...

Claims

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Application Information

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IPC IPC(8): G06T7/00
Inventor 王祎璠孔渊
Owner CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
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