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Quick three-dimensional shape measurement method without phase unwrapping based on Fourier transform

A technology of Fourier transform and three-dimensional topography, which is applied in measurement devices, instruments, optical devices, etc., can solve the problems of complex algorithms and unfavorable application promotion, and achieve the simplification of measurement process, algorithm complexity, and error avoidance. Effect

Active Publication Date: 2015-11-11
NORTHEASTERN UNIV
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Problems solved by technology

In essence, it does not avoid the process of phase unwrapping and projector calibration, so the whole algorithm is still relatively complicated, which is not conducive to application and promotion.

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  • Quick three-dimensional shape measurement method without phase unwrapping based on Fourier transform
  • Quick three-dimensional shape measurement method without phase unwrapping based on Fourier transform
  • Quick three-dimensional shape measurement method without phase unwrapping based on Fourier transform

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Embodiment Construction

[0036] Below, combined with Figure 1-8 Specific embodiments of the present invention will be further described in detail.

[0037] The present invention is based on a fast three-dimensional shape measurement method based on Fourier transform without phase unwrapping. The overall flow of the method is as follows figure 1 As shown, the specific implementation steps are as follows:

[0038] Step 1. Establish a binocular stereo vision inspection platform, mainly including two parallel industrial cameras (left camera and right camera) and professional projector equipment;

[0039] Step 2. Perform stereo calibration on the industrial camera to obtain camera calibration parameters, which are used in the binocular stereo correction process;

[0040] Step 3. Under the condition of not using any active light source, the images of the left camera and the right camera are captured at the same time, which are called the left and right original images;

[0041] Step 4. Use a professiona...

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Abstract

The invention relates to a quick three-dimensional shape measurement method without phase unwrapping based on Fourier transform, and the method enables the technology of binocular stereo matching to be employed in the three-dimensional shape measurement based on Fourier transform, avoids a complex process of phase unwrapping, does not need projection calibration, and can achieve a matching result with the sub-pixel level precision. The technology of binocular stereo matching is used for achieving rough matching, and a preliminary disparity map is obtained. Afterwards, the preliminary disparity map serves as a constraint condition and is used for the phase matching of a wrapped phase diagram obtained through Fourier transform. Finally, a three-dimensional point cloud diagram is generated. The method does not need any process of phase unwrapping in space or time, reduces the algorithm complexity, and avoids an error caused by the phase unwrapping. The method does not need projector calibration, avoids complex projector calibration, can enable a measurement process to be more simplified, also can avoid an error caused by the projector calibration, and is good in development prospect especially for the technology of quick three-dimensional measurement.

Description

technical field [0001] The invention relates to a fast three-dimensional shape measurement method based on Fourier transform without phase unwrapping, specifically a fast three-dimensional measurement method based on Fourier transform, which can be used for target three-dimensional measurement in high-speed real-time state, and belongs to three-dimensional The field of shape measurement. Background technique [0002] Three-dimensional shape measurement technology aims to obtain three-dimensional information of objects. This technology has been widely used in various fields. How to perform fast and high-precision measurement has always been the research focus of three-dimensional measurement. Optical-based three-dimensional measurement technology is one of the most promising directions at present, and three-dimensional measurement based on structured light technology is one of the research hotspots, and its application is also very extensive. [0003] The Fourier profile thr...

Claims

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Application Information

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IPC IPC(8): G01B11/245
Inventor 宋克臣胡少鹏颜云辉董志鹏温馨
Owner NORTHEASTERN UNIV
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