The invention relates to a Mach-Zundel type shearing waveform measuring system and a shearing waveform measuring method thereof. The system comprises an interference system consisting of an incident panel, an emission panel, a fixed seat, a first reflecting panel, a second reflecting panel, a third reflecting panel, a fourth reflecting panel, a first guide rail, a second guide rail, an imaging lens, an aperture and a CCD imaging instrument. An adjusting device for ensuring accuracy comprises an auto-collimation collimator tube, a first reflecting mirror, a laser collimating light source, a reference transmitting and reflecting mirror, a second reflecting mirror, a lens screen, a first pentaprism, and a second pentaprism. A control processing system comprises a piezo-electric controller and a computer processing system. The system and the method are suitable for measuring waveform with large aperture and under a diffraction limit, and particularly suitable for being used on a light source waveform with short coherent length. The system and the method can conduct dephasing processing, and are provided with an entire system for real-time adjustment and calibration.