Two-diensional three-frequency dephase measuring method base on color structural light
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HUAZHONG UNIV OF SCI & TECH
- Publication Date
- 2007-12-19
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of reverse engineering measurement, and in particular relates to a two-dimensional three-frequency phase resolution measurement method based on colored structured light. Background technique
[0002] The binocular grating projection structured light measurement method is a relatively advanced measurement method at present. It combines the structured light method and the stereo vision method. The projected light beam is projected on the surface of the object through the grating to form structured light. The light is coded into fringe patterns. These deformed fringes are recorded by two CCD cameras at a certain angle to the center of the projector. Each spatial point in the measurement space is encoded according to a series of projected gratings recorded. After decoding and phase calculation, each spatial point is obtained. The encoded information and phase information of a spatial point can be used to determine its spa...