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Calibration method of surface structured light three-dimensional measurement system

A technology of three-dimensional measurement and calibration method, which is applied in measurement devices, optical devices, image data processing, etc., can solve problems such as poor accuracy, and achieve the effect of avoiding error coupling interference and improving calibration accuracy.

Active Publication Date: 2020-04-17
BEIJING LUSTER LIGHTTECH
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Problems solved by technology

[0005] This application provides a calibration method for a surface-structured light three-dimensional measurement system to solve the problem of poor accuracy of the current surface-structured light system calibration method

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  • Calibration method of surface structured light three-dimensional measurement system
  • Calibration method of surface structured light three-dimensional measurement system
  • Calibration method of surface structured light three-dimensional measurement system

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Embodiment Construction

[0070] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0071] see figure 1 , is a flowchart of a calibration method for a surface structured light three-dimensional measurement system provided in an embodiment of the present application.

[0072] Such as figure 1 As shown, the calibration method of the surface structured light three-dimensional measurement system provided in the embodiment of t...

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Abstract

The invention discloses a calibration method of a surface structured light three-dimensional measurement system. The method comprises the following steps: calibrating internal parameters and distortion of a camera by using a glass checkerboard calibration plate covering a full field of view; respectively projecting left and right field-of-view projection images to a special calibration board whitearea of a semi-white semi-checkerboard pattern, and calibrating the internal reference and distortion of the projector; vertically moving the special calibration plate, and establishing a three-dimensional reconstruction coordinate system; calibrating camera external parameters and projector external parameters according to the three-dimensional reconstruction coordinate system. According to thecalibration method provided by the invention, a special calibration board with half white and half checkerboard is designed; the three-dimensional reconstruction coordinate system is constructed in cooperation with the vertical lifting platform to calibrate the projector, the camera and the surface structured light system, camera calibration, projector calibration and system external parameter calibration are separated in the overall calibration scheme and do not depend on a structured light algorithm, coupling interference of various errors in the calibration process is avoided, and thereforethe calibration precision is greatly improved.

Description

technical field [0001] The present application relates to the technical field of machine vision measurement, in particular to a calibration method for a surface structured light three-dimensional measurement system. Background technique [0002] Surface structured light three-dimensional measurement system plays an important role in industrial automation, including three-dimensional measurement, positioning, detection and other aspects. The surface structured light system consists of a projector and a camera. The projector projects coded structured light onto the surface of the measured object. The camera collects the modulation pattern and obtains the surface geometric information of the measured object through a decoding algorithm. The commonly used coded structured light includes phase shift fringe, Gray code etc. In order to obtain the actual 3D information, it is necessary to calibrate the parameters of the camera and projector, as well as the system external parameter...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/80G01B11/00
CPCG06T7/85G01B11/002
Inventor 张晓元杨艺
Owner BEIJING LUSTER LIGHTTECH
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