Method and device for bad cluster statistics based on FPGA lookup table
A statistical method and look-up table technology, applied in the field of image recognition, can solve the problems of inconvenient FPGA implementation and reducing the number of comparison operations.
Active Publication Date: 2021-04-20
BEIJING LUSTER LIGHTTECH
View PDF4 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] In order to overcome the problem that the bad cluster statistical method of the image sensor needs to perform multiple comparison operations to obtain statistical results, which is not convenient for FPGA implementation, the application provides a bad cluster statistical method and device based on an FPGA lookup table, which can reduce the number of comparisons. Number of calculations, suitable for implementation on FPGA
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0075] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with aspects of the invention as recited in the appended claims.
[0076] In the following detailed description, numerous specific details are set forth in order to provide a comprehensive understanding of the application, but those skilled in the art will understand that the application may be practiced without these specific details. In other embodiments, well-known methods, procedures, components and circuits have not been described in detail so as not to un...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The embodiment of the present application provides a method and device for bad cluster statistics based on FPGA lookup table. The scanning method of the FPGA lookup table performs a scan process on the bad point according to the bad point position data, creates the original lookup table based on the scanned data, merges the scanned data, updates the lookup table according to the merged processed data, and obtains the updated Lookup table, data comparison processing to obtain the final lookup table, according to the final lookup table to count the number of bad clusters. The technical solution provided by the embodiment of the present application introduces the lookup table that FPGA is best at, applies the position data detected by the image bad point to the lookup table, and cooperates with the lookup table and data scanning processing to obtain the final lookup table, according to the final The lookup table counts the number of bad clusters, reduces the number of comparison operations, and is suitable for implementation on FPGA.
Description
technical field [0001] The present disclosure relates to the technical field of image recognition, in particular to a bad cluster statistics method and device based on an FPGA lookup table. Background technique [0002] An image sensor is a device that converts an optical image into an electronic signal, and is widely used in fields such as photography, image acquisition, and industrial measurement. Generally, an image sensor includes a large number of photosensitive units, and each photosensitive unit corresponds to a pixel in an image output by the image sensor. Due to reasons such as the manufacturing process, transportation or storage methods, some photosensitive units of the image sensor are damaged and cannot normally receive light. The pixels corresponding to these photosensitive units that cannot normally receive light in the image are called dead pixels. Multiple consecutive bad pixels form bad clusters, and the size and number of bad clusters have a great impact o...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06F16/22G06F16/23
CPCG06T7/0002
Inventor 郭慧姚毅
Owner BEIJING LUSTER LIGHTTECH