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A common mode inductance testing mechanism

A technology of testing mechanism and common mode inductance, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as hidden dangers, influence, and outflow of defective products

Active Publication Date: 2021-05-11
HAINING LIANFENG DONGJIN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the subjective consciousness of manual judgment, and the alarm sound of the instrument will also be affected by the environment of the whole workshop
Therefore, the conventional instrument testing method has certain hidden dangers, that is, the defective products will flow out to the client

Method used

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  • A common mode inductance testing mechanism
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  • A common mode inductance testing mechanism

Examples

Experimental program
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Embodiment 1

[0021] Embodiment one, refer to Figure 1 to Figure 3 As shown, a general-purpose common-mode inductance electrical parameter test equipment includes a frame, an assembly line 1 installed on the frame for conveying inductance, an inductance withstand voltage test device 2 arranged along the conveying direction of the assembly line, and a discharge with poor withstand voltage device, an inductance comprehensive electrical parameter testing device 3, the inductance withstand voltage test device is used to carry out a withstand voltage test on the inductance, the inductance comprehensive electrical parameter test device is used to test the electrical parameters of the inductance, and the described inductive withstand voltage discharge device Remove the unqualified inductance from the pipeline when the inductance withstand voltage test fails. In the present invention, the assembly line is used for directional feeding, and the inductance to be tested respectively passes through the...

Embodiment 2

[0034] Embodiment two, refer to Figure 4 and Figure 5 As shown, on the basis of the first embodiment, in order to further detect other performance parameters of the inductor. A third test station is provided downstream of the inductance comprehensive electric parameter test device, and other performance tests of the inductance can be performed at the third test station. In this way, there is no need to set the good product forehearth and defective product forehearth in the first example. However, in order to remove the bad inductance from the assembly line to ensure that the good product inductance is transported along the assembly line to the third test station for detection, the assembly line in this embodiment is provided with an interruption position between the inductance comprehensive electrical parameter test device and the third test station 12. Below the interrupted part, there is a defective product discharge channel 121 arranged obliquely. At the same time, the...

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Abstract

The invention discloses a common-mode inductance testing mechanism, which comprises a frame, an assembly line arranged on the frame for conveying inductance, an inductance withstand voltage test device arranged along the conveying direction of the assembly line, a discharge device for poor withstand voltage, and an inductance comprehensive circuit. Parameter testing device, the inductance withstand voltage test device is used to carry out the withstand voltage test on the inductance, the inductance comprehensive electrical parameter test device is used to test the electrical parameters of the inductance, and the discharge device with poor withstand voltage does not perform the inductance withstand voltage test When qualified, the unqualified inductor is removed from the pipeline. The invention realizes unmanned testing of electrical performance parameters of common-mode inductor products, automatic discrimination and automatic discrimination of OK products and NG products, eliminates the subjectivity of human judgment, and brings about quality optimization.

Description

technical field [0001] The invention relates to the technical field of inductance automatic testing. Background technique [0002] At present, the conventional method of withstand voltage testing and comprehensive electrical parameter testing of electronic products is to use single-person operation, the instrument prompts good or bad products, and manually screens OK products and NG products. Due to the subjective consciousness of manual judgment, and the alarm sound of the instrument will also be affected by the environment of the whole workshop. Therefore, the conventional instrument testing method has certain hidden dangers, that is, defective products will flow out to the client. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a common-mode inductance testing mechanism to realize automatic testing of inductance and automatically separate bad inductance from good inductance. [0004] In order to solve the ab...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/01
Inventor 邹晨炼沈利峰周晓媛
Owner HAINING LIANFENG DONGJIN ELECTRONICS
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