Automatic detection method and device and electronic device

A technology for automatic detection and electronic equipment, applied in the direction of detecting faulty computer hardware, software testing/debugging, etc., can solve problems such as waste of resources, and achieve the effect of reducing waste of power consumption

Pending Publication Date: 2019-06-25
HUNAN GOKE MICROELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When the generation of test matching use cases takes a long time, it will waste a lot of time and resources due to repeated generation

Method used

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  • Automatic detection method and device and electronic device
  • Automatic detection method and device and electronic device
  • Automatic detection method and device and electronic device

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0020] It should be noted that like numerals and let...

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Abstract

The embodiment of the invention provides an automatic detection method and device and an electronic device, and relates to the field of circuit detection. The embodiment of the invention provides an automatic detection method and device and an electronic device, and the method comprises the steps: obtaining a test case according to an obtained configuration parameter and a test case pool; and obtaining a matching case according to the obtained configuration parameters and a matching case pool. Therefore, when the same test case needs to be repeatedly executed and the same matching case needs to be compared in an automatic detection process of a programming device, an executed test case can be directly obtained from the test case pool according to the configuration parameters, a compared matching case can be obtained from the matching case pool according to the configuration parameters, and the test case is sent to the programming device, so that the programming device operates the testcase to obtain test output; and the test output sent by the programming device is received, and a detection result is generated by comparing the test output with the matching case. Therefore, automatic detection of the programming device is completed.

Description

technical field [0001] The invention relates to the field of circuit detection, in particular to an automatic detection method, device and electronic equipment. Background technique [0002] With the increasing capacity and scale of programming devices, programmable devices such as FPGA, PAL, GAL, CPLD, etc. are more and more widely used. In order to ensure the correctness of programming-based device engineering, a large number of test cases are required to verify. The current testing is generally divided into manual testing and automated testing. When testing in large quantities, automation is necessary. Automatic detection is to generate test cases according to the preset configuration parameters, program the device to run the test case to get the test output, run the test case on the PC to get the matching case, and verify the correctness of the programming device project by comparing the test output and the matching case. [0003] However, when performing automated tes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F11/22
Inventor 吴万馨
Owner HUNAN GOKE MICROELECTRONICS
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