Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Power supply system for product aging and reliability tests

A technology of power supply and reliability, which is applied in the direction of power supply testing, measuring electricity, and measuring electrical variables, etc. It can solve problems such as failure performance consistency, abnormal operation of field instrument power supplies, and large fluctuations in power supply voltage, so as to improve safety and reliability. performance, reduce the failure of the instrument under test, and ensure the effect of safety

Inactive Publication Date: 2019-07-12
NANJING NEW POWER ELECTRIC
View PDF9 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The power supply voltage of the industrial site fluctuates greatly and the interference is strong, which may easily lead to abnormal operation or even damage of the power supply of the field instrument
Although industrial instrumentation suppliers have done many modular reliability designs, the deterioration, failure, and performance consistency of components will cause the product to be unable to be used normally on site

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Power supply system for product aging and reliability tests
  • Power supply system for product aging and reliability tests
  • Power supply system for product aging and reliability tests

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] like Figure 1-3 As shown, the present invention discloses a power supply system for product aging and reliability tests, including a host computer monitoring system 1, a power supply voltage output circuit 2, a power supply detection circuit 3, a fault protection circuit 4 and an MCU control circuit 5 , the host computer monitoring system 1 is used to display the fault of the instrument under test 6, and is used to adjust the test parameters of the instrument under test 6; the power supply voltage output circuit 2 provides power supply for the instrument under test 6, and the power supply detection circuit 3 is used to detect the instrument under test 6 When the MCU control circuit 5 detects that the instrument under test fails, the power supply voltage output circuit 2 is disconnected through the fault protection circuit 4, and the MCU control circuit 5 is connected with the power supply voltage output circuit 2, the power supply detection circuit 3 and the power suppl...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of power supplies. The power supply system for the product aging and reliability test comprises an upper computer monitoring system, a power supply voltageoutput circuit, a power supply power detection circuit, a fault protection circuit and an MCU control circuit, and the upper computer monitoring system is used for displaying faults of a tested instrument and setting test parameters of the tested instrument; the power supply voltage output circuit provides a power supply for the tested instrument, the power supply power detection circuit is usedfor detecting the power supply power of the tested instrument, and when the MCU control circuit detects that the tested instrument has a fault, the power supply voltage output circuit is disconnectedthrough the fault protection circuit. According to the invention, various severe power supply voltages which are connected to a power supply port in series in an industrial field are simulated, powersupply performance aging and reliability tests are carried out through the method, faults of a tested instrument power supply part caused by external high-pulse voltage interference can be improved, and reliability and stability of the tested instrument power supply part are improved.

Description

technical field [0001] The invention relates to the technical field of power supply, in particular to a power supply system for product aging and reliability tests. Background technique [0002] The power supply voltage of the industrial site fluctuates greatly and the interference is strong, which may easily lead to abnormal operation or even damage of the power supply of the field instrument. Although industrial instrumentation suppliers have done many modular reliability designs, the deterioration, failure, and differences in performance consistency of components will cause the products to be unable to be used normally on site. Therefore, it is particularly important to test the power supply performance of the instrument before it is applied to the field. Contents of the invention [0003] The invention provides a power supply system for product aging and reliability tests, which can simulate various harsh conditions encountered by the power supply in actual use, makin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/28G01R31/40
CPCG01R1/28G01R31/40
Inventor 董健李金祥赵星张红云董伟
Owner NANJING NEW POWER ELECTRIC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com