In-situ device for measuring surface crack spreading rate of thermal barrier coating system

A technology of crack growth rate and thermal barrier coating, which can be used in measurement devices, electromagnetic measurement devices, and electric/magnetic solid deformation measurement.

Inactive Publication Date: 2019-07-23
BEIJING UNIV OF TECH
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The generation and expansion of cracks accelerate the speed at which the ceramic layer falls off the blade, and the crack growth rate is affected by temperature. Therefore, it is difficult to measure the crack growth rate on the surface of the ceramic layer. A device that can control the temperature and measure the mechanical properties of the sample in real time is imminent

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  • In-situ device for measuring surface crack spreading rate of thermal barrier coating system
  • In-situ device for measuring surface crack spreading rate of thermal barrier coating system
  • In-situ device for measuring surface crack spreading rate of thermal barrier coating system

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Embodiment

[0023] An in-situ device for measuring the crack growth rate on the surface of a thermal barrier coating system. The device ensures that the temperature of the thermal barrier coating system can be changed during the crack growth rate measurement experiment, and the length of the crack growth process on the surface of the ceramic layer can be monitored in real time. The signal representing the crack is converted into a voltage signal that can be processed by the computer through the conversion of the analog signal. The device comprises a computer (101), a substrate (102), an adhesive layer (103), an aluminum oxide film (104), a ceramic layer (105), a heating plate (106), a fixed plate (107), a resistance strain gauge (108 ) and capture card (109).

[0024] The substrate (102), the bonding layer (103), the aluminum oxide film (104), the ceramic layer (105), and the heating plate (106) are arranged on the fixing plate (107) from inside to outside;

[0025] The computer (101) an...

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Abstract

The invention discloses an in-situ device for measuring the surface ceramic layer crack spreading rate of a thermal barrier coating system. The device comprises a computer (101), a substrate (102), abonding layer (103), an aluminum oxide film (104), a ceramic layer (105), a heating board (106), a fixed board (107), resistance strain gauges (108) and a capture card (109). Through adoption of the device, the temperature of the thermal barrier coating system can be changed in the experimental process of measuring the surface ceramic layer crack spreading rate of the thermal barrier coating system, and the spreading rate in the crack spreading process is monitored in real time. The device is simple in structure, and convenient to operate.

Description

technical field [0001] The invention relates to an in-situ device for measuring the crack growth rate on the surface of a thermal barrier coating system. The device ensures that the heating temperature of the thermal barrier coating system can be changed during the crack growth rate measurement experiment, and the detection pattern temperature rise-heat preservation- The invention relates to the crack growth rate on the surface of a ceramic layer during the cooling process, and belongs to the technical field of sample mechanical property experiments. Background technique [0002] The thermal barrier coating system has been introduced into engineering applications due to its good thermal protection effect. The main principle is that the low thermal conductivity of the outermost ceramic material hinders the heat and protects the blade from direct contact with the high temperature environment. However, the crack propagation and connection on the surface of the ceramic layer wil...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/00G01B7/16
CPCG01B7/18G01N25/00
Inventor 雷钧刘世庚徐艳洁刘慧付豪陈玉玲王秦
Owner BEIJING UNIV OF TECH
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