Manufacturing system fault tracing method and system based on digital twin model
A manufacturing system and twin technology, applied in the direction of electrical digital data processing, complex mathematical operations, special data processing applications, etc., to achieve the effect of improving diagnosability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.
[0039] The manufacturing system fault tracing method based on the digital twin model of this embodiment, such as figure 1 shown, including the following steps:
[0040] Step A, build a mathematical model of the fault traceability of the digital twin on the simulation platform:
[0041] Step A1, obtain the functional coupling relationship, nodes and directed edges among the components in the manufacturing system through the structural analysis and design technology SADT, and establish the fault coupling network of the manufacturing system;
[0042] Step A2, obtain the coupling connection relationship between the multi-attributes of the fault mode in the fault coupling network of the manufacturing system through the multi-color set, and establish an information processing model based on the multi-color...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com