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Device, method and storage medium for measuring gradient delay and first-order field inhomogeneity

A gradient delay and uniformity technology, applied in the field of MRI

Active Publication Date: 2021-09-17
SIEMENS SHENZHEN MAGNETIC RESONANCE
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] However, there is no method capable of measuring both parameters simultaneously

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  • Device, method and storage medium for measuring gradient delay and first-order field inhomogeneity
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  • Device, method and storage medium for measuring gradient delay and first-order field inhomogeneity

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Embodiment Construction

[0057] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0058] As used in the description of the present invention and the appended claims, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise.

[0059] The inventor found through analysis that the gradient delay may cause the echo offset of the GRE sequence, and the first-order field inhomogeneity may also cause the echo offset of the GRE sequence. However, the echo offset caused by the gradient delay will not change with the The echo shift caused by the first-order field inhomogeneity will change with the gradient polarity reversal. Based on this analysis, the inventor proposed the solution of the present invention.

[0060] The present invention is de...

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Abstract

The present invention provides an apparatus, method and computer storage medium for measuring gradient delay and first-order field inhomogeneity. The method includes: sending a first gradient mode trigger instruction to a pulse sequence generator of the MRI system, so that: the pulse sequence generator controls the gradient waveform generator to output +- pulses, and controls the radio frequency transmitter to output the first radio frequency pulse; The controller sends the second gradient mode trigger instruction, so that: the pulse sequence generator controls the gradient waveform generator to output -+ pulse, and controls the radio frequency transmitter to output the second radio frequency pulse; according to the generation time of the first echo corresponding to the + - pulse, The generation time of the second echo corresponding to the ‑+ pulse is used to calculate the gradient delay and the first-order field inhomogeneity of the MRI system. The invention can simultaneously measure the gradient delay and the first-order field inhomogeneity of the MRI system.

Description

technical field [0001] The invention relates to the technical field of MRI (Magnetic Resonance Imaging, magnetic resonance imaging), in particular to a device, a method and a computer storage medium for measuring gradient time delay and first-order field inhomogeneity of an MRI system. Background technique [0002] MRI technology has become a very useful tool in medical diagnosis. The MRI hardware system mainly includes: magnet subsystem, magnetic field gradient (referred to as gradient) subsystem, radio frequency subsystem, spectrometer subsystem, and main computer. Among them, the gradient subsystem mainly includes: gradient current amplifier and gradient coil, the radio frequency subsystem mainly includes: transmitting coil and receiving coil, and the spectrometer subsystem mainly includes: pulse sequence generator, gradient waveform generator, transmitter and receiver, etc. . [0003] During the imaging process, under the control of the pulse sequence generator, the tr...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/54
CPCG01R33/54
Inventor 史中强
Owner SIEMENS SHENZHEN MAGNETIC RESONANCE