Capacitor appearance detection method and device, storage medium and processor

A capacitance and appearance technology, applied in the field of appearance inspection, can solve the problems of low capacitance appearance inspection efficiency, incomplete appearance inspection of capacitance, etc., and achieve the effect of improving the detection accuracy

Active Publication Date: 2022-01-07
ZHUHAI GREE INTELLIGENT EQUIP CO LTD +1
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  • Abstract
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Problems solved by technology

[0004] The main purpose of this application is to provide a detection method and device, a storage medium and a processor for the appearance of a capacitor, so as to solve the problem that the detection of the appearance of the capacitor in the related art is not comprehensive, and manual secondary detection is required, resulting in the detection efficiency of the appearance of the capacitor. not high problem

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  • Capacitor appearance detection method and device, storage medium and processor
  • Capacitor appearance detection method and device, storage medium and processor
  • Capacitor appearance detection method and device, storage medium and processor

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Embodiment Construction

[0036] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0037] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of an area of ​​the application, not all embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0038] It should be noted that the terms "first" and "second" in the...

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Abstract

The application discloses a method and device for detecting the appearance of a capacitor, a storage medium and a processor. The method includes: acquiring a target image of the appearance of the capacitor, wherein the target image is a plurality of images, and the plurality of images at least include a top image of the capacitor, a side image, a shell image of the capacitor, and an image of the capacitor terminal; dividing the target image into at least A detection area; at least one detection area is used to detect defects in the appearance of the capacitor in the target image, wherein the defects in the appearance of the capacitor include at least one of the following: defects on the top of the capacitor, defects on the side of the capacitor, defects on the capacitor terminals, and capacitors shell defects. Through the present application, the problem in the related art that the detection of the appearance of the capacitor is not comprehensive, and manual secondary detection is required, resulting in low efficiency of the detection of the appearance of the capacitor.

Description

technical field [0001] The present application relates to the field of appearance detection, in particular, to a method and device for detecting the appearance of a capacitor, a storage medium, and a processor. Background technique [0002] In the first-off technology, the existing capacitor appearance inspection method can only detect defects such as flat or protruding aluminum shells, zoomed terminals, or skewing of the capacitor, but cannot detect zoomed terminals on the top of the capacitor, white tops, and poor coding on the side. The character printing is poor, and the detection defect is single, so it is impossible to conduct a comprehensive detection of the capacitor. At the same time, after the automatic detection of the capacitor, manual secondary detection is required, the detection efficiency is not high, and it cannot meet the increasingly high quality requirements. [0003] Aiming at the above-mentioned problems existing in related technologies, no effective s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01N21/956
CPCG01N21/8851G01N21/95607G01N2021/8887G01N2021/95615
Inventor 杨智慧宋明岑朱虹
Owner ZHUHAI GREE INTELLIGENT EQUIP CO LTD
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