Test method and device and readable storage medium
A test method and test parameter technology, applied in the computer field, can solve the problems of wasting time, test software error reporting, and high error rate, and achieve the effect of reducing error rate, improving efficiency, and avoiding error reporting.
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[0063] The terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes unlisted steps or units, or optionally further includes For other steps or units inherent in these processes, methods or apparatuses.
[0064] The present application proposes a testing method, which can avoid the problem of inconsistency between the test parameters and the parameter format required by the interface to be tested, prevent the test software from reporting errors during the test, reduce the error rate during the test, and save test time.
[0065] figure 1 It ...
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