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Test method and related device

A testing method and a technique for testing requests, which are applied in the computer field and can solve problems such as the non-existence of algorithmic testing methods

Active Publication Date: 2019-11-12
SHENZHEN INTELLIFUSION TECHNOLOGIES CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, in the prior art, there is no test method for the algorithm running on the chip

Method used

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Embodiment Construction

[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0038] Each will be described in detail below.

[0039] The terms "first" and "second" in the specification and claims of the present invention and the above drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps ...

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Abstract

The invention discloses a test method and a related device, and the method comprises the steps: transmitting a test request to a chip, the test request carrying an image; receiving a test response sent by the chip, the test response carrying M1 groups of attribute data, the M1 groups of attribute data being obtained by processing the image by the chip; acquiring M2 groups of attribute data corresponding to the image from a database; matching the M1 groups of attribute data with the M2 groups of attribute data to determine whether K groups of attribute data which are not matched with the M2 groups of attribute data exist in the M1 groups of attribute data or not; and if K groups of attribute data which are not matched with the M2 groups of attribute data exist in the M1 groups of attributedata, determining an error attribute calculation algorithm included in the chip according to the K groups of attribute data. By implementing the embodiment of the invention, an algorithm running on the chip is tested, and an error algorithm included in the chip can be accurately found out.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a testing method and related devices. Background technique [0002] With the continuous innovation of information technology, the development speed of chips is also getting faster and faster. As the chip develops, so does the testing of the algorithms running on the chip. Generally speaking, the algorithm running on the chip is directly migrated from other devices. Therefore, after the migration is completed, it is often necessary to test the algorithm running on the chip to determine whether there is any problem with the algorithm. [0003] Currently, in the prior art, there is no testing method for the algorithm running on the chip. Contents of the invention [0004] The embodiment of the present invention provides a testing method and a related device. Implementing the embodiment of the present invention realizes testing and running the algorithm on the chip, which is be...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06K9/00G06K9/62
CPCG06F11/2236G06F11/2273G06V40/70G06F18/22Y02D10/00
Inventor 兰凯
Owner SHENZHEN INTELLIFUSION TECHNOLOGIES CO LTD