Birefringence crystal snapshot Mueller matrix imaging polarization measurement system
A birefringent crystal and Mueller matrix technology, which is applied in the field of birefringent crystal snapshot Mueller matrix imaging deviation measurement system, can solve the problems of low extinction ratio and transmittance, narrow spectral bandwidth, etc., and achieve high extinction ratio and wide spectrum , the effect of high transmittance
Inactive Publication Date: 2019-11-15
GUANGXI TEACHERS EDUCATION UNIV
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The present invention effectively solves the disadvantages of low extinction ratio and transmittance, narrow spectral bandwidth, etc.
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[0044] Such as figure 1 As shown, a birefringent crystal snapshot Mueller matrix imaging deviation measurement system includes a light source (1), and the side of the light source (1) emitting light is sequentially provided with a first collimator lens (2), a first imaging mirror (4), the second collimating lens (5), the second imaging mirror (7) and the image acquisition device (8), the first collimating lens (2) and the first imaging mirror (4) are provided with The first polarization modulation module (3), the second polarization modulation module (6) is arranged between the second collimator lens (5) and the second imaging mirror (7), the light source (1), the first collimator The central point of the straight lens (2), the first imaging mirror (4), the second collimating lens (5), the second imaging mirror (7), the image acquisition device (8) and the first polarization modulation module (3 ), the central points of the second polarization modulation module (6) are all lo...
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The invention relates to a birefringence crystal snapshot Mueller matrix imaging polarization measurement system, and belongs to the technical field of optical image information collection. The systemcomprises a light source, first and second polarization modulation modules, an image obtaining device, first and second collimating lenses and first and second imaging mirrors, the first polarizationmodulation module comprises two first improved SAVA polariscopes, a polarizer and a first half wave plate, the second polarization modulation module comprises two second improved SAVA polariscopes, apolarization analyzer and a first half wave plate, and each improved SAVA polariscope comprises two SAWA plates and a second or third half wave plate. Compared with polarized grating snapshot Muellermatrix imaging polarization measurement technology at present, the system of the invention has the advantages that the transmissivity and extinction ratio are higher, the spectrum can be selected ina wider range, and all 16 Mueller matrix images of the target object at any time can be obtained in one step.
Description
technical field [0001] The invention relates to the technical field of optical image information collection, in particular to a birefringent crystal snapshot Mueller matrix imaging deviation measurement system. Background technique [0002] The polarization grating snapshot Mueller matrix imaging polarization measurement technology currently used has two major disadvantages. One is that the extinction ratio and transmittance are low, and the spectral bandwidth is narrow. The other is that it can only be used to measure targets that are not sensitive to the spectrum. Contents of the invention [0003] In view of the above problems, the present invention provides a birefringent crystal snap-shot Mueller matrix imaging deviation measurement system, which mainly cuts 1 beam of linearly polarized light into 4 Beams of linearly polarized light, the 4 beams of linearly polarized light are positioned on the sample by forming interference fringes through a convex lens, and the inte...
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Login to View More IPC IPC(8): G01J4/00
CPCG01J4/00
Inventor 张晶曹奇志胡宝清邓婷李建映徐艳华樊东鑫王华华
Owner GUANGXI TEACHERS EDUCATION UNIV