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A Measuring Method of Radiation Sensitive Parameters of Operational Amplifier

An operational amplifier, radiation-sensitive technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve good application prospects, improve the measurement range, and the effect of good measurement accuracy

Active Publication Date: 2021-05-25
NORTHWEST INST OF NUCLEAR TECH
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In order to improve the accurate measurement of the parameters of the operational amplifier in the environment of ionizing radiation and solve the problems caused by the coupling of the radiation sensitive parameters of the operational amplifier to the traditional measurement technology, the invention provides a method for measuring the radiation sensitive parameters of the operational amplifier

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  • A Measuring Method of Radiation Sensitive Parameters of Operational Amplifier

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Embodiment Construction

[0038] Below in conjunction with accompanying drawing and specific embodiment the content of the present invention is described in further detail.

[0039] The invention provides a simple and feasible method for measuring sensitive parameters of operational amplifiers after radiation, which solves the problem of accurate measurement of electrical parameters of operational amplifiers after irradiation. Extract etc. The method provides scanning voltage directly to the input terminal of the operational amplifier through the existing test equipment or source meter, monitors the current or voltage change information of each port, and obtains the radiation sensitive parameters of the device through calculation and analysis. The measurement of this method is a direct measurement method. The radiation-sensitive parameters of the operational amplifier are measured by high-precision test equipment or source meters, rather than relying on the loop of the auxiliary operational amplifier, ...

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Abstract

The invention provides a method for measuring radiation-sensitive parameters of an operational amplifier, which solves the problems caused by the coupling of the radiation-sensitive parameters of the operational amplifier to the traditional measurement technology, and improves the accurate measurement of the parameters of the operational amplifier in an ionizing radiation environment. A method for measuring radiation-sensitive parameters of an operational amplifier, comprising the following steps: Step 1, installing the operational amplifier under test; connecting the power supply terminal VCC and the ground terminal VEE of the operational amplifier under test to a constant voltage source, and connecting the positive phase input terminal Vin+ to a scanning voltage source, the negative phase input terminal Vin-connected to the constant voltage source, the output terminal Vout connected to the voltage monitoring terminal; step 2, setting the measurement parameters; setting the output value of the constant voltage source connected to the negative phase input terminal Vin- to 0V or a specified value; According to the device manual of the operational amplifier under test and the offset voltage drift after irradiation, set the scanning voltage range of the scanning voltage source; Step 3, test the operational amplifier under test; Step 4, extract sensitive parameters.

Description

technical field [0001] The invention relates to the field of radiation effect testing of electronic components, in particular to a method for measuring radiation sensitive parameters of operational amplifiers. Background technique [0002] Operational amplifiers are an indispensable part of aerospace electronic devices, and the electrical performance test of space electronic devices is an essential link. Usually, the radiation resistance of space electronic devices in space is assessed and verified through ground simulation tests. At present, operational amplifiers often use the auxiliary operational amplifier method for electrical characteristic testing. This measurement method has better test accuracy and speed in conventional testing. However, operational amplifiers will be affected by radiation in ionizing radiation environments. After irradiation, operational amplifiers Various performance parameters degrade to varying degrees. At this time, the coupling between degrade...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/002
Inventor 马武英姚志斌董观涛何宝平王祖军盛江坤薛院院
Owner NORTHWEST INST OF NUCLEAR TECH