Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An ultra-small interferometric ultrafast x-ray fiber optic detector

An interferometric, X-ray technology, applied in the field of ultra-small interferometric ultrafast X-ray fiber optic detectors, can solve problems affecting accuracy, signal distortion, and low detection sensitivity

Active Publication Date: 2021-04-20
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, limited by photoelectric signal collection, electron transit time and high-bandwidth electronic signal transmission, the time resolution of XRD can only be about 100 ps, ​​and the detection sensitivity in the hard X-ray energy region is low. In addition, XRD requires The high-voltage power supply system is configured, and the ultra-fast electrical signal can be transmitted to the signal acquisition system through a long-distance microwave cable. Distortion is prone to occur during the distance transmission process, which affects the accuracy of the inverse X-ray radiation evolution process and causes signal distortion

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An ultra-small interferometric ultrafast x-ray fiber optic detector
  • An ultra-small interferometric ultrafast x-ray fiber optic detector
  • An ultra-small interferometric ultrafast x-ray fiber optic detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to make the purpose, advantages and features of the present invention clearer, an inverted image-enhanced ultrafast imaging detector proposed by the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that: the drawings are all in a very simplified form and use inaccurate proportions, which are only used to facilitate and clearly illustrate the purpose of the embodiments of the present invention; secondly, the structures shown in the drawings are often actual structures part; again, each drawing needs to display different emphasis points, and sometimes adopts different scales.

[0036] The specific structure of an ultra-small interferometric ultra-fast X-ray fiber detector provided in this embodiment is as follows: figure 1 As shown, it includes a sleeve 6, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
lengthaaaaaaaaaa
diameteraaaaaaaaaa
lengthaaaaaaaaaa
Login to View More

Abstract

The invention relates to an ultra-small interference type ultra-fast X-ray optical fiber detector. The detector is small in size, high in time resolution and strong in anti-electromagnetic interference. It mainly includes a sleeve, a metal beryllium window, a semiconductor ultrafast detection chip, a GRIN lens, a single-mode fiber and a fiber optic circulator; the sleeve is coaxially arranged with a GRIN lens, a semiconductor ultrafast detection chip and The metal beryllium window; the semiconductor ultrafast detection chip includes a semiconductor crystal and a reflective film coated on the front and rear surfaces of the semiconductor crystal respectively; two reflective films and the semiconductor crystal form a Fabry-Perot interference cavity; the single-mode optical fiber One end is a pigtail, and the pigtail is coaxially arranged on the GRIN lens, and the other end is connected to the second port of the fiber circulator; the first port of the fiber circulator is connected to an external tunable laser, and the fiber circulator The third port is connected with an external high-speed photoelectric detection system.

Description

technical field [0001] The invention relates to the technical field of ultrafast diagnosis, in particular to an ultrasmall interference type ultrafast X-ray optical fiber detector. Background technique [0002] In inertial confinement fusion research, the duration of the implosion process of the target capsule is only hundreds of picoseconds, and the precise diagnosis of the process requires picosecond or even sub-picosecond time resolution. The currently used electric vacuum X-ray diode (XRD) is the main diagnostic device for X-ray ultrafast diagnosis. However, limited by photoelectric signal collection, electron transit time and high-bandwidth electronic signal transmission, the time resolution of XRD can only be about 100 ps, ​​and the detection sensitivity in the hard X-ray energy region is low. In addition, XRD requires The high-voltage power supply system is configured, and the ultra-fast electrical signal can be transmitted to the signal acquisition system through a ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/24
CPCG01T1/24
Inventor 何凯高贵龙闫欣李少辉田进寿汪韬辛丽伟尹飞韦永林徐向晏王兴刘虎林陈萍温文龙王俊峰赛小锋卢裕
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products