Unlock instant, AI-driven research and patent intelligence for your innovation.

Sample clamp

A sample holder and sample technology, applied in the direction of sampling, test sample preparation, manufacturing tools, etc., can solve the problems of limiting sample quality, sample preparation success rate and sample preparation efficiency, sample damage, etc., to avoid damage and improve quality effect

Active Publication Date: 2019-12-17
YANGTZE MEMORY TECH CO LTD
View PDF10 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, for samples, the existing mounting method is an irreversible operation mode. If the sample is to be further tested, the sample needs to be destroyed before the sample can be taken out.
[0004] The existing sample mounting process is easy to cause damage to the sample, which greatly limits the quality of the sample, the success rate of sample preparation and the efficiency of sample preparation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sample clamp
  • Sample clamp
  • Sample clamp

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] Hereinafter, various embodiments of the present invention will be described in more detail with reference to the accompanying drawings. In the various drawings, the same elements are represented by the same or similar reference numerals. For the sake of clarity, the various parts in the drawings are not drawn to scale.

[0024] It should be understood that when describing the structure of the clamp, when a layer or an area is referred to as being "on" or "above" another layer, or another area, it can mean directly on the other layer or area, or It also includes other layers or regions between it and another layer or another region. And, if the fixture is turned over, the layer or area will be "below" or "below" the other layer or area.

[0025] In order to describe the situation of being directly on another layer and another area, this article will adopt the expression "directly on..." or "on and adjacent to...".

[0026] In the following, many specific details of the prese...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a sample clamp. The sample clamp comprises a first beam, a fastener and a sample pedestal. One end of the first beam is opened to form a first arm and a second arm, and the first beam further comprises a cavity communicated with the opening. The fastener is connected with the first arm and the second arm. The sample pedestal is accommodated in the cavity and clamps a sample. When the fastener makes the first arm and the second arm close to each other, the first arm and the second arm clamp the sample pedestal, and the sample pedestal clamps the sample. When the fastenerseparates the first arm from the second arm, the first arm and the second arm loosen the sample pedestal, and the sample pedestal loosens the sample. Through the acting force of the first arm and thesecond arm, the sample pedestal can be clamped or loosened, and the sample pedestal can clamp or loosen the sample. Therefore, the installation and disassembly of the sample are completed, damage tothe sample is avoided, and the quality of the sample, the success rate of sample preparation and the efficiency of sample preparation are improved.

Description

Technical field [0001] The present invention relates to the technical field of semiconductor manufacturing, and more specifically, to a sample holder. Background technique [0002] In the field of semiconductor manufacturing, metallographic analysis is one of the important means of experimental research on metal materials. Quantitative metallographic principles are used to determine the three-dimensional space of the alloy structure from the measurement and calculation of the surface of the two-dimensional metallographic sample or the metallographic microstructure of the film. Morphology to establish a quantitative relationship between alloy composition, organization and properties. [0003] Metallographic analysis includes sample cutting, mounting samples (mounting), mechanical sample preparation, inspection samples, and metallographic analysis. Each operation must be performed carefully and strictly in accordance with the operating requirements, because any operating errors may a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N1/32B25B11/00
CPCG01N1/286G01N1/32B25B11/00G01N2001/2866
Inventor 李亨特
Owner YANGTZE MEMORY TECH CO LTD