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Self-test method, corresponding circuit and device

A technology of circuit and test sequence, which is applied in the field of self-test method and corresponding circuit and equipment, can solve the problems of sensor function damage, increase product cost and test time, and achieve the effect of improving the solution

Pending Publication Date: 2020-03-03
STMICROELECTRONICS SRL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this approach has the disadvantage of increasing product cost and testing time
Also, if a connection failure occurs after EWS testing (say, during assembly or during sensor life), sensor functionality may be compromised

Method used

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  • Self-test method, corresponding circuit and device
  • Self-test method, corresponding circuit and device
  • Self-test method, corresponding circuit and device

Examples

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Embodiment Construction

[0025] In the following description, one or more specific details are illustrated in order to provide an in-depth understanding of examples of embodiments of the present specification. Embodiments may be obtained without one or more of the specific details, or with other methods, components, materials, etc. In other instances, well-known structures, materials, or operations are not shown or described in detail so as not to obscure aspects of the embodiments.

[0026] References to "an embodiment" or "one embodiment" in the framework of this specification are intended to mean that a specific configuration, structure or characteristic described with respect to the embodiment is included in at least one embodiment. Thus, phrases such as "in an embodiment" or "in one embodiment," which may be present at one or more points in this specification, do not necessarily refer to the same embodiment.

[0027] Furthermore, particular configurations, structures or characteristics may be co...

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Abstract

The embodiment of the invention relates to a self-test method, a corresponding circuit and a device. A touchscreen resistive sensor includes a network of resistive sensor branches coupled to a numberof sensor nodes arranged at touch locations of the touchscreen. A test sequence is performed by sequentially applying to each sensor node a reference voltage level, jointly coupling to a common line the other nodes, sensing a voltage value at the common line, and declaring a short circuit condition as a result of the voltage value sensed at the common line reaching a short circuit threshold. A current value level flowing at the sensor node to which the reference voltage level is applied is sensed and a malfunction of the resistive sensor branch coupled with the sensor node to which a referencevoltage level is applied is generated as a result of the current value sensed at the sensor node reaching an upper threshold or lower threshold.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to Italian Patent Application No. 102018000008022 filed on August 9, 2018, which is hereby incorporated by reference. technical field [0003] Embodiments relate to a self-test method and corresponding circuits and devices, which may be used in touch screen devices, for example. Background technique [0004] The growing popularity of smartphones and interactive netbooks has led to the increasing incorporation of touch interfaces into these devices. [0005] Force touch sensors can be used to differentiate between different levels of force applied to the touchscreen surface. A resistive touch sensor may employ a resistive Wheatstone bridge sensor array. The applied force may cause deformation of the touch panel, which then causes a change in resistance in the Wheatstone bridge. [0006] Methods for verifying the connection integrity of touch panel sensors have traditionally included ...

Claims

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Application Information

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IPC IPC(8): G06F3/041G06F3/045G01R31/52G01R31/54G01R31/56G01R31/66G01R31/00G01R19/165
CPCG06F3/0416G06F3/045G01R31/00G01R19/165H03K17/9647H03K2217/9605G01R31/52G06F3/04144G01R31/2829G06F2203/04102G09G3/006
Inventor C·M·伊波利托A·雷克希亚A·西塞罗P·隆巴尔多M·韦亚纳
Owner STMICROELECTRONICS SRL
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