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Sliding type electronic component testing device

A technology for electronic components and testing devices, which is applied in the field of sliding electronic component testing devices, and can solve problems such as complex structures

Active Publication Date: 2020-03-13
CHROMA ATE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But the structure of above-mentioned known detection equipment is complicated, and the occupied volume is also considerable

Method used

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  • Sliding type electronic component testing device
  • Sliding type electronic component testing device
  • Sliding type electronic component testing device

Examples

Experimental program
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Embodiment Construction

[0026] Before the sliding electronic component testing device of the present invention is described in detail in this embodiment, it should be noted that in the following description, similar components will be denoted by the same component symbols. Furthermore, the drawings of the present invention are only for schematic illustration, which are not necessarily drawn to scale, and not all details are necessarily presented in the drawings.

[0027] Please also see figure 1 , figure 2 and image 3 , which are respectively a perspective view, an exploded view and a sectional view of the first embodiment of the present invention. As shown in the figure, the first embodiment of the present invention mainly includes a base 2, a sliding seat 3, a pressing device 4, a pressure generating device 5 and an actuating module 6, and the base 2 includes a base plate 20, a first sliding guide 21 and chip accommodating module 22, in this embodiment, the first sliding guide 21 is the two s...

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Abstract

The invention relates to a sliding type electronic component testing device. The sliding type electronic component testing device mainly comprises a base, a sliding seat and a pressing device. When the electronic component is to be tested, the electronic component is placed in a chip accommodating module, and the base and the sliding seat form relative sliding through the guidance of a first sliding guide piece and a second sliding guide piece, so that the pressing and abutting block of a pressing and abutting device is aligned and pressed and abutted against the electronic component. Furthermore, the electronic component can be pressed and abutted through the pressing and abutting device, sufficient contact pressure is provided, and internal force balance can be achieved in the device through a counter-acting force formed by the contact pressure and the elastic restoring force of the probe. Besides, the base and the sliding seat can slide horizontally or at any angle, the overall sizeis greatly reduced especially when different states are switched, and the overall mechanism of the equipment is simplified.

Description

technical field [0001] The invention relates to a sliding type electronic component testing device, in particular to a device suitable for crimping electronic components on a testing jig, which is beneficial for testing the quality of electronic components. Background technique [0002] Generally, when testing an electronic component, the electronic component to be tested must first be placed in the test socket, and then the test arm (pressing device) is used to press down on the electronic component from above the electronic component to be tested and exert pressure, so as to Ensure that the contacts on the lower surface of the electronic components are in complete electrical contact with the probes in the test socket, thereby avoiding misjudgment of test results caused by poor contact. However, the volume of the test arm in the existing test equipment is huge, especially the height direction occupies a lot of volume, which is not conducive to the spatial arrangement of the...

Claims

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Application Information

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IPC IPC(8): G01R1/04
CPCG01R1/0408
Inventor 欧阳勤一陈建名吕孟恭
Owner CHROMA ATE