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Off-axis three-mirror imaging system based on free-form surface substrate phase element

A phase element and three-mirror imaging technology, which is applied in optical components, instruments, optics, etc., can solve the problems of surface shape not conforming to the actual situation and increase the complexity of the system, and achieve multi-degree of design freedom, easy processing, and small volume Effect

Active Publication Date: 2021-02-02
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In some system requirements, the light must be deflected at a large angle, which will cause the surface shape to be unrealistic
In some extreme design tasks, freeform surfaces provide insufficient variables, which will lead to a higher number of components used in the system design, thereby increasing the complexity, size and weight of the system

Method used

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  • Off-axis three-mirror imaging system based on free-form surface substrate phase element
  • Off-axis three-mirror imaging system based on free-form surface substrate phase element
  • Off-axis three-mirror imaging system based on free-form surface substrate phase element

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Embodiment Construction

[0013] The off-axis three-mirror imaging system 100 based on the free-form surface substrate phase element provided by the present invention will be further described in detail below with reference to the drawings and specific embodiments.

[0014] see figure 1 and 2 , the present invention provides an off-axis three-mirror imaging system 100 based on a free-form surface substrate phase element, including: a primary reflector 102 , a primary reflector 104 , a third reflector 106 and a detector 108 . The secondary reflector 104 is located on the reflection optical path of the main reflector 102; the third reflector 106 is located on the reflection optical path of the secondary reflector 104; the detector 108 is located on the reflection optical path of the third reflector 106, so The primary reflector 102 , the secondary reflector 104 and the third reflector 106 are all free-form surface substrate phase elements, and their geometrical substrates are all free-form surfaces, and...

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Abstract

The invention relates to a compact off-axis imaging system based on a free-form surface substrate phase element, comprising: a main reflector, a primary reflector, a third reflector and a detector; the main reflector is used to square light to form a first reflected light; the secondary reflector is used to reflect the first reflected light twice to form a second reflected light; the third reflector is used to reflect the second reflected light again to form a third reflected light; the detector is used for receiving the third reflected light and forming an image. The primary reflector, the secondary reflector, and the third reflector are free-form surface base phase elements; the optical path of the first reflected light, the optical path of the second reflected light and the optical path of the third reflected light overlap each other , the system is compact.

Description

technical field [0001] The invention relates to the technical field of optical system design, in particular to an off-axis three-mirror imaging system based on a free-form surface base phase element. Background technique [0002] Compared with spherical and aspherical surfaces, freeform surfaces provide more degrees of freedom for optical design, so they can provide stronger aberration correction capabilities. In recent years, with the continuous development of advanced manufacturing technology, freeform surfaces have been successfully used in the fields of imaging and illumination. As consumer demands grow, freeform surfaces are expected to be used to design ultra-compact, high-performance systems. In some system requirements, the light must be deflected at a large angle, which will cause the surface shape to be unrealistic. In some extreme design tasks, the freeform surface provides insufficient variables, which will lead to a higher number of components used in the syst...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B17/06
CPCG02B17/0626
Inventor 杨通段璎哲程德文王涌天
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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