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Calibration method and device, processor, electronic equipment, storage medium

A calibration method and imaging device technology, applied in the computer field, can solve the problems of sampling time deviation and poor effect, etc.

Active Publication Date: 2022-01-28
SHANGHAI SENSETIME INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the pose deviation between the imaging device and the inertial sensor, or the sampling time deviation between the imaging device and the inertial sensor, the effect of the specific function based on the imaging device and the inertial sensor is not good

Method used

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  • Calibration method and device, processor, electronic equipment, storage medium
  • Calibration method and device, processor, electronic equipment, storage medium
  • Calibration method and device, processor, electronic equipment, storage medium

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Embodiment Construction

[0132] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0133] The terms "first", "second" and the like in the specification and claims of the present application and the above drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process...

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Abstract

The application discloses a calibration method and device, a processor, electronic equipment, and a storage medium. The method includes: acquiring at least two poses of the imaging device and at least two first sampling data of inertial sensors; performing spline fitting processing on the at least two poses to obtain a first spline curve, and performing spline fitting on the at least two poses performing spline fitting processing on the two first sampling data to obtain a second spline curve; according to the first spline curve and the second spline curve, the space-time between the imaging device and the inertial sensor is obtained A deviation, the space-time deviation includes at least one of a pose conversion relationship and a sampling time offset.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular to a calibration method and device, a processor, electronic equipment, and a storage medium. Background technique [0002] Based on the data collected by the imaging device and the data collected by the inertial sensor, a variety of specific functions can be realized. Due to the pose deviation between the imaging device and the inertial sensor, or the sampling time deviation between the imaging device and the inertial sensor, the effect of the specific function based on the imaging device and the inertial sensor is not good. Therefore, how to determine the spatiotemporal deviation (including at least one of pose deviation and sampling time deviation) between the imaging device and the inertial sensor is of great significance. Contents of the invention [0003] The present application provides a calibration method and device, a processor, electronic equipment, and ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C25/00
CPCG01C25/005G01P21/00H04N23/6812G01P15/02G01P21/02G06T7/80
Inventor 慕翔陈丹鹏
Owner SHANGHAI SENSETIME INTELLIGENT TECH CO LTD