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An accelerometer test device

An accelerometer and testing device technology, which is used in measurement devices, speed/acceleration/shock measurement, and testing/calibration of speed/acceleration/shock measuring equipment, etc., can solve problems such as inability to meet test requirements, and achieve simple structure and high efficiency Tall, small footprint effect

Active Publication Date: 2022-03-22
航天科工惯性技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the market share of medium and low-precision accelerometer products has grown rapidly, and the existing test production capacity can no longer meet the test requirements of the rapidly increasing number of products

Method used

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Embodiment Construction

[0026] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0027] The acceleration test device of the present invention includes a four-point turning mechanism 1, a heat insulation transfer structure 2, and a mounting platform body 3, and each of the heat insulation transfer structure 2 and the mounting platform body 3 is two. On both sides of the four-point overturning mechanism 1, the heat-insulating transfer structure 2 and the mounting platform body 3 are sequentially fixed and installed.

[0028] The four-point turning mechanism 1 is a long and narrow structure with four supporting beams and two mounting planes, and is mainly used to realize the four-point turning test of the accelerometer within the range of 360° in the circumferential direction. It achieves the flatness control requirements of each surface through the boss structure at the contact point between the installation surface and th...

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Abstract

The invention discloses an accelerometer testing device, which comprises a four-point turning mechanism (1), a heat-insulating transfer structure (2), and a mounting platform body (3). There are two heat insulation transition structures (2) and two mounting platforms (3), which are sequentially fixedly installed on the installation planes (11) of the turning mechanism on both sides of the four-point turning mechanism (1). The four-point overturning mechanism (1) includes two overturning mechanism installation planes (11), which have the same shape and size, are rectangular or square, and are connected by support beams (13); on the two overturning mechanism installation planes (11) At eight right angles, 16 boss structures (12) are set in the same extension direction as the installation plane (11) of the turning mechanism. The boss structures (12) constitute the four-point turning mechanism (1) for realizing four points The flipped datum plane. The invention has the characteristics of simple structure, easy operation, small occupied area, high efficiency and low cost.

Description

technical field [0001] The invention belongs to the technical field of accelerometers, and in particular relates to an accelerometer testing device. Background technique [0002] The quartz flexible accelerometer mainly uses the force feedback principle to obtain a current proportional to the input acceleration, and obtains the input acceleration information by sampling the current. As an inertial instrument, the performance of the quartz flexible accelerometer is characterized by the calibration of its model equation coefficients. Four-point method, eight-point method, twelve-point method, etc. can be used to test the coefficients of the accelerometer model equation. The most commonly used method is the four-point method, that is, within the range of 360° in the circumferential direction, 4 points are equally divided, one for every 90° Points, real-time output of the accelerometer at each position is realized through the test equipment and tooling, and the output value of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01P21/00
CPCG01P21/00
Inventor 付秀娟张晟毕根凤李平吴楠于湘涛韩旭彭振新张吉
Owner 航天科工惯性技术有限公司