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A high-precision on-line rapid measurement device and measurement method for the thickness of an aluminum substrate

A measuring device and aluminum substrate technology, which is applied in the fields of microelectronics, intelligent manufacturing, mechatronics, and electronic information, can solve the problems of mixing materials and indistinguishable visual inspection methods, and achieve high test accuracy, fast measurement speed, and device compact effect

Active Publication Date: 2021-03-30
XIDIAN UNIV
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  • Abstract
  • Description
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Problems solved by technology

[0003] Aluminum substrates are one of the main raw materials of mechanical hard disks. At present, the thickness difference between aluminum substrates of different specifications has reached tens of microns. Conventional visual inspection methods can no longer distinguish them, and it is easy to cause mixed materials.
In addition, with the continuous improvement of hard disk performance requirements, the consistency requirements for the thickness and size of aluminum substrates are also getting higher and higher. The offline sampling method commonly used in the industry can no longer meet the current performance requirements. An online high-precision Thickness automatic measurement system has become an urgent problem to be solved in this field

Method used

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  • A high-precision on-line rapid measurement device and measurement method for the thickness of an aluminum substrate
  • A high-precision on-line rapid measurement device and measurement method for the thickness of an aluminum substrate
  • A high-precision on-line rapid measurement device and measurement method for the thickness of an aluminum substrate

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Embodiment Construction

[0030] The invention will be further described in detail below in conjunction with the accompanying drawings and embodiments, but it is not used as a basis for any limitation on the invention.

[0031] Such as figure 1 combine figure 2 As shown, a high-precision on-line fast measuring device for aluminum substrate thickness of the present invention includes a horizontal driving device 3, a vertical driving device 13 and a conveyor rail 4 installed on the base platform 10, the horizontal driving device 3 and the vertical driving device Device 13 is directly driven by a servo electric cylinder. The transmission rail 4 is located at the side of the horizontal drive device 3, and the vertical drive device 13 is located between the horizontal drive device 3 and the transmission rail 4; the horizontal drive device 3 is equipped with a support 1, and two attitude adjustment devices 2 are installed on the support 1, each A laser emitting head 5 is respectively installed on each att...

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Abstract

The invention discloses a high-precision online rapid measurement device and method for the thickness of aluminum substrates. The device comprises a horizontal driving device, a vertical driving device and a conveying rail which are installed on a basic platform, wherein the horizontal driving device is provided with a pair of posture adjusting devices, each posture adjusting device is provided with a laser emitting head, and the pair of laser emitting heads are respectively connected with optical fibers; the vertical driving device is provided with a cam combination, a lever combination and aguide base; a guide rod penetrates through the guide base; the cam combination is driven by a power mechanism to drive the lever combination to jack up the guide rod, so that the plurality of aluminum substrates are driven one by one to sequentially rise to the pair of laser emitting heads to be oppositely emitted to measure the thickness of the aluminum substrates. The measurement device is compact in structure, achieves the online real-time thickness measurement of the whole box of aluminum substrates, is high in measurement precision and speed, and improves the measurement precision of thethickness of the aluminum substrates.

Description

technical field [0001] The invention belongs to the technical field of mechatronics, and relates to a high-precision on-line rapid measuring device and a measuring method for the thickness of an aluminum substrate, which are mainly used in but not limited to the fields of electronic information, microelectronics, intelligent manufacturing and the like. Background technique [0002] Due to its data recoverability, mechanical hard drives have irreplaceable advantages of solid-state drives in data centers and other application fields, and still maintain a strong demand for shipments. With the continuous development of electronic information, microelectronics and intelligent manufacturing technology and the continuous increase in the demand for hard disk capacity, access speed and portability, the thickness of a single platter of a mechanical hard disk is continuously reduced, and the rotational speed is continuously increased. [0003] Aluminum substrates are one of the main ra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/06
CPCG01B11/06
Inventor 张大兴高宏伟冯兰胜章云
Owner XIDIAN UNIV
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