Dense parallel line structured light three-dimensional scanning method and system
A three-dimensional scanning, parallel line technology, applied in the field of three-dimensional measurement, can solve the problems of sparse reconstruction results, assisted positioning of landmark points, affecting reconstruction results, etc.
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[0042] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, and the technical solutions in the embodiments of the present invention will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Way. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention.
[0043] The present invention aims at problems such as sparse and uneven distribution of traditional multi-line structured light scanning reconstruction results, need for auxiliary positioning of marker points, multi-line intersections affect reconstruction results, etc., and provides a three-dimensional scanning method of dense parallel line structured light, which not ...
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