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Dense parallel line structured light three-dimensional scanning method and system

A three-dimensional scanning, parallel line technology, applied in the field of three-dimensional measurement, can solve the problems of sparse reconstruction results, assisted positioning of landmark points, affecting reconstruction results, etc.

Active Publication Date: 2020-06-19
武汉玄景科技有限公司
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Problems solved by technology

[0005] The present invention aims at problems such as sparse and uneven distribution of traditional multi-line structured light scanning reconstruction results, need for auxiliary positioning of marker points, multi-line intersections affect reconstruction results, etc., and provides a three-dimensional scanning method of dense parallel line structured light, which not only retains the traditional The advantages of multi-line structured light, while solving the problems of traditional multi-line structured light, include the following steps:

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  • Dense parallel line structured light three-dimensional scanning method and system
  • Dense parallel line structured light three-dimensional scanning method and system
  • Dense parallel line structured light three-dimensional scanning method and system

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[0042] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, and the technical solutions in the embodiments of the present invention will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Way. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention.

[0043] The present invention aims at problems such as sparse and uneven distribution of traditional multi-line structured light scanning reconstruction results, need for auxiliary positioning of marker points, multi-line intersections affect reconstruction results, etc., and provides a three-dimensional scanning method of dense parallel line structured light, which not ...

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Abstract

The invention provides a dense parallel line structured light three-dimensional scanning method and system. The method comprises the following steps: designing a dense parallel line single-frame pattern; projecting a pre-designed single-frame dense parallel line to the surface of the measured object through a projector; shooting the modulated dense parallel line pattern by a binocular camera, andcarrying out high-precision line extraction and segmentation; determining a candidate projector column number value of each extraction point on the segmented line segment by utilizing a relative relationship of a space plane formed by the binocular camera and the dense parallel lines; deleting and selecting candidate projector column number values by utilizing the consistency of the extracted point projector column numbers on the same line segment; verifying the validity of the column number values of the candidate projectors by utilizing the continuity of the column numbers of the adjacent line segments; and reconstructing the point cloud point by point according to the image point coordinates on the line segments and the corresponding projector column numbers. The problems that a traditional multi-line structured light scanning reconstruction result is sparse and uneven in distribution, mark point auxiliary positioning is needed, and the reconstruction result is affected by multi-line crossing are solved.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement, in particular to a method and system for three-dimensional scanning of dense parallel line structured light. Background technique [0002] In ordinary image modeling, the light source is ambient light or white light, which has not been encoded, and image recognition depends entirely on the feature points of the object itself. Therefore, matching has always been a difficult point in image modeling. The difference of the structured light method is that the projected light source is coded, and the image that is projected onto the object by the coded light source and modulated by the depth of the object surface is captured. Because the structured light source has a lot of coding features, it is very convenient to match the feature points, that is, the structured light method actively provides many feature points for matching, and no longer needs to use the feature points of the object its...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254G01B11/2545
Inventor 黄文超刘改龚静
Owner 武汉玄景科技有限公司
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