A Memristor Test Circuit

Abstract

The invention belongs to the technical field of microelectronic device testing, and relates to a memristor testing circuit. The memristor testing circuit comprises an input module, a current limitingmodule, a voltage stabilizing module, a reversing control module, a measuring module and an output module. The input module is a pulse generation device and is used for generating a voltage pulse signal and controlling an ADC and a DAC; the voltage stabilization module realizes voltage stabilization, so that the voltage at one end of the memristor is equal to the input voltage; the current limiting module realizes that the current does not exceed the current limiting current in the pulse test process; the reversing control module realizes the setting and resetting process that the memristor does not need to apply negative voltage; the measurement module realizes voltage measurement and is used for calculating the difference of the measured voltage; the output module uses an ADC as the output module to realize voltage collection and circuit control. Compared with conventional test equipment, the test equipment can be quickly switched between a measurement mode and an excitation mode, continuous short pulses and user-defined waveforms can be output, and use of large equipment is avoided.

Description

technical field [0001] The invention belongs to the technical field of testing microelectronic devices, and relates to a memristor testing circuit. Background technique [0002] Memristor is the fourth basic component after resistors, inductors, and capacitors. Its advent shocked the international electronic technology community. Memristor is a new type of non-linear resistor with memory function. Its resistance value can change accordingly with the direction and amount of charge flowing through, so as to memorize the amount of charge flowing through it at every moment. When there is no charge flowing through it, the resistance value can remain the same. Therefore, as a new type of electronic device with nonlinear dynamic resistance-switching characteristics, high speed, low power consumption, high integration, and storage and computing fusion functions, memristor research on its test and characterization methods and its application in flip-flop circuits is of great importa...

AI Technical Summary

Problems solved by technology

[0004] However, at present, there is no uniform specification standard and dedicated standard test system for memristor testing methods. Advantest V93K, Tektronix 4200 and other equipment are commonly used for testing, but these equipment are complicated to operate and poorly targeted, and cannot achieve memristor performance. The need for rapid test of the device

Moreover, 4200 and other instruments focus on the measurement of DC and AC characteristics. When testing pulse signals, especially short pulse signals, the operation is more cumbersome, and it is necessary to switch repeatedly between the measurement mode and the excitation mode, which cannot realize automated testing.

Therefore, existing memristor test methods need to be improved

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