Defect Mapping Method

Abstract

The present invention relates to the technical field of defect mapping, in particular to a defect mapping method, comprising the following steps: step S1: detecting the version of the mysql database; step S2: using the version-compliant mysql database to create a memory table for storing defect data, The memory table contains the coordinate information of the corresponding position of the defect data; step S3: create an index for the field corresponding to the defect data; step S4: store the defect data including bright field defects and dark field defects into the memory table; step S5: Determine the distance between the defects in the bright field and the defects in the dark field; step S6: judge whether the defects are at the same position according to the distance; step S7: perform defect mapping on the two defects at the same position. By using the mysql database to realize the mapping, the defect mapping has a faster mapping speed than the traversal comparison method, which improves the efficiency of defect detection and is conducive to increasing the speed of product quality detection.

Description

technical field [0001] The present invention relates to the technical field of defect mapping, in particular to a defect mapping method. Background technique [0002] In the existing defect mapping scheme, it is generally to traverse and compare the defects in each category, map the two defects after determining that the defects are in the same position, and then judge whether it is a real defect through preset logic . Due to the slow processing speed in the processing process, it affects the efficiency of defect detection. Therefore, how to overcome the problem of slow processing speed and affect the efficiency of defect detection in the current defect mapping scheme has become the focus to be solved. Contents of the invention [0003] In order to overcome the above technical problems, the present invention provides a defect mapping method. [0004] The solution of the present invention to solve the technical problem is to provide a defect mapping method, comprising the...

AI Technical Summary

Problems solved by technology

In the processing process, the processing speed is relatively slow, which affects the efficiency of defect detection. Therefore, how to overcome the problem of slow processing speed and affecting the efficiency of defect detection in the current defect mapping scheme has become the focus of solution.

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