Unlock instant, AI-driven research and patent intelligence for your innovation.

A method and BLE device for low-power bluetooth BLE product testing

A low-power Bluetooth, product testing technology, applied in security devices, reducing energy consumption, using return channels for error prevention/detection, etc., can solve problems such as limited quantity, communication rate, etc.

Active Publication Date: 2022-07-19
SHENZHEN GOODIX TECH CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are many disadvantages in the current solution, such as: the wired connection between the hardware test circuit and the device under test limits the number of devices under test that are connected to the test system at the same time, the communication rate, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and BLE device for low-power bluetooth BLE product testing
  • A method and BLE device for low-power bluetooth BLE product testing
  • A method and BLE device for low-power bluetooth BLE product testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings.

[0049] Chip-based application circuits, especially BLE chips, need to perform function or performance tests on the application circuit after the module factory is patched, and some application circuits also need to write specific configuration information to the chip. At present, the mainstream test scheme is to complete the test operation through wired connection, and the entire test system consists of the host computer, hardware test circuit and equipment to be tested. There are many drawbacks in the current solution, for example, the wired connection between the hardware test circuit and the device under test limits the number and communication rate of the device under test that are simultaneously connected to the test system.

[0050] To this end, an embodiment of the present application proposes a method for testing low-power ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiments of the present application disclose a method and a BLE device for low-power Bluetooth BLE product testing, which can improve testing efficiency. The method is used for a test device to test a device under test with BLE function, the test device is a node in a BLE MESH network, and the first test firmware is programmed in the test device, and the method includes: the The test device accesses the MESH network according to the first test firmware; the test device connects the device to be tested to the MESH network according to the first test firmware, and uses the MESH network to access the device to be tested. test equipment.

Description

technical field [0001] The embodiments of the present application relate to the field of Bluetooth low energy consumption technology, and more particularly, to a method and a BLE device for low energy consumption Bluetooth BLE product testing. Background technique [0002] The Bluetooth Low Energy (BLE) chip is the core application circuit. After the chip is manufactured, the function or performance of the application circuit needs to be tested. Some application circuits also need to write specific configuration information into the chip. [0003] At present, the mainstream test solutions are to connect the main control device (hardware test circuit) and the device under test through a wired connection to complete the test operation, and then write the application firmware into the device under test through a wired connection. The whole test system consists of the host computer, hardware test circuit and equipment to be tested. The current solution has many drawbacks, for e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/10H04B17/11H04B17/20H04B17/21H04B17/318H04W4/80H04W12/00H04W12/69H04L1/16
CPCH04B17/318H04W4/80Y02D30/70
Inventor 林飞
Owner SHENZHEN GOODIX TECH CO LTD