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Defect detection method and device and computer readable storage medium

A defect detection and defect technology, applied in the field of image processing, can solve the problems of low screen accuracy and uneven brightness

Active Publication Date: 2020-10-13
HEFEI LCFC INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When detecting the defect area of ​​the screen, because the screen itself has a certain degree of uneven brightness, the image background of the screen has periodic textures, and the ripple-like light and dark changes caused by the mixing phenomenon are prone to occur during the screen detection process. The accuracy of screen defect detection is low

Method used

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  • Defect detection method and device and computer readable storage medium
  • Defect detection method and device and computer readable storage medium
  • Defect detection method and device and computer readable storage medium

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Embodiment Construction

[0028] In order to make the purpose, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0029] figure 1 It is a schematic diagram of the implementation flow of a defect detection method according to an embodiment of the present invention.

[0030] see figure 1 On the one hand, the embodiment of the present invention provides a defect detection method, the method includes: operation 101, perform image enhancement processing on ...

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PUM

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Abstract

The invention discloses a defect detection method and device and a computer readable storage medium, and the method comprises the steps: carrying out the image enhancement of a specified image, and obtaining a defect enhanced image; traversing pixel values on the defect enhanced image according to a defect threshold to obtain pixel values exceeding the defect threshold; performing connected domainsegmentation based on the pixel value exceeding the defect threshold to obtain a defect area; and performing defect judgment on the defect area through a linear threshold value to determine a defectstate corresponding to the defect area, so that the method has the characteristic of objectively and accurately evaluating the screen defects.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to a defect detection method, device and computer-readable storage medium. Background technique [0002] During the screen detection process, it is necessary to detect whether there is a defective area on the screen. Screen defect areas are areas on the screen that have low contrast compared to the screen background, have various shapes, blurred edges, low visibility to the naked eye, or other defects. When detecting the defect area of ​​the screen, because the screen itself has a certain degree of uneven brightness, the image background of the screen has periodic textures, and the ripple-like light and dark changes caused by the mixing phenomenon are prone to occur during the screen detection process. The accuracy of screen defect detection is low. Contents of the invention [0003] Embodiments of the present invention provide a defect detection method, device ...

Claims

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Application Information

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IPC IPC(8): G06T5/00G06T7/00G06T7/11G06T7/136G06T7/62
CPCG06T7/11G06T7/136G06T7/0002G06T7/62G06T5/70
Inventor 罗文君
Owner HEFEI LCFC INFORMATION TECH
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