Optimization processing method for brightness temperature data of two-dimensional synthetic aperture microwave radiometer

A microwave radiometer and comprehensive aperture technology, applied in the field of data processing, can solve problems such as non-conformity with theoretical expectations and discrete results.

Active Publication Date: 2020-10-23
AEROSPACE INFORMATION RES INST CAS
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method can obtain brightness temperature observations at a fixed angle, the results are relatively discrete.
Moreover, the brightness temperature from multiple angles...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optimization processing method for brightness temperature data of two-dimensional synthetic aperture microwave radiometer
  • Optimization processing method for brightness temperature data of two-dimensional synthetic aperture microwave radiometer
  • Optimization processing method for brightness temperature data of two-dimensional synthetic aperture microwave radiometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments, so that those skilled in the art can implement it with reference to the text of the description.

[0039] Such as figure 1 As shown, the present invention provides an optimized processing method for brightness temperature data of a two-dimensional synthetic aperture microwave radiometer, which includes the following steps:

[0040] Step 1. According to the SMOS brightness temperature data, obtain the H polarization brightness temperature data and the V polarization brightness temperature data of the SMOS respectively; at the same time, obtain the SMAP brightness temperature data that matches the SMOS in time and space according to the SMAP brightness temperature data;

[0041] Step 2: Perform the first nonlinear fitting and the second nonlinear fitting based on the brightness temperature data obtained in Step 1, and then complete the optimization process...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an optimization processing method for brightness temperature data of a two-dimensional synthetic aperture microwave radiometer, wherein the method comprises the following steps: step 1, respectively obtaining H polarization brightness temperature data and V polarization brightness temperature data of an SMOS according to the brightness temperature data of the SMOS; meanwhile, obtaining SMAP brightness temperature data matched with the SMOS in time and space according to the SMAP brightness temperature data; and step 2, carrying out first nonlinear fitting and second nonlinear fitting according to the brightness temperature data obtained in the step 1, and then completing optimization processing according to translation transformation; or, carrying out the first nonlinear fitting according to the brightness temperature data obtained in the step 1, and completing the optimization processing according to the fixed-point regression fitting. According to the invention, the optimized multi-angle brightness temperature can be obtained, information waste is not caused, and high consistency with the brightness temperature of the SMAP can be maintained. According to the method, the loss of the optimized brightness temperature is less, and the space coverage degree of the SMOS data is greatly improved.

Description

Technical field [0001] The invention relates to the technical field of data processing, in particular to an optimized processing method for brightness temperature data of a two-dimensional synthetic aperture microwave radiometer. Background technique [0002] Microwave remote sensing of cloud, rain and fog has little effect, and has the advantages of working all-weather and all-day; at the same time, the penetration ability of microwave can obtain information of a certain depth on the surface. These advantages make it widely used in hydrology, atmosphere, agriculture and other fields. The signal obtained by microwave remote sensing on the ground is processed into the microwave radiance temperature (brightness temperature, TB). On this basis, the ground surface parameter can be inverted, such as soil moisture inversion, and used in downstream applications. [0003] The working mode of microwave remote sensing is divided into active (active) microwave remote sensing and passive (pas...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01J5/00G01N22/04
CPCG01J5/007G01N22/04G01J5/80
Inventor 赵天杰彭志晴施建成
Owner AEROSPACE INFORMATION RES INST CAS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap