Optimization processing method for brightness temperature data of two-dimensional synthetic aperture microwave radiometer
A microwave radiometer and comprehensive aperture technology, applied in the field of data processing, can solve problems such as non-conformity with theoretical expectations and discrete results.
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[0038] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments, so that those skilled in the art can implement it with reference to the text of the description.
[0039] Such as figure 1 As shown, the present invention provides an optimized processing method for brightness temperature data of a two-dimensional synthetic aperture microwave radiometer, which includes the following steps:
[0040] Step 1. According to the SMOS brightness temperature data, obtain the H polarization brightness temperature data and the V polarization brightness temperature data of the SMOS respectively; at the same time, obtain the SMAP brightness temperature data that matches the SMOS in time and space according to the SMAP brightness temperature data;
[0041] Step 2: Perform the first nonlinear fitting and the second nonlinear fitting based on the brightness temperature data obtained in Step 1, and then complete the optimization process...
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