Automatic screen defect testing method based on POS machine model

An automated testing, POS machine technology, applied in testing optical performance, instruments, cash registers, etc., to reduce time costs, improve testing efficiency, and reduce manual testing errors.

Active Publication Date: 2020-11-13
AITIWEIER ELECTRONICS TECH BEIJING
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The object of the present invention is to provide a kind of automatic testing method of screen defect based on POS machine model, thus solve the foregoing problems existing in the prior art

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  • Automatic screen defect testing method based on POS machine model

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain the present invention, and are not intended to limit the present invention.

[0023] Such as figure 1 As shown, in the present embodiment, a method for automatic testing of screen defects based on the POS machine model is provided, including the following steps,

[0024] S1. Connect the PC end to the POS machine to be tested; the PC end sends a collection instruction including model information to the POS machine to be tested;

[0025] S2. The POS machine to be tested receives the collection instruction;

[0026] S3, the POS machine to be tested judges whether the model in the acquisition instruction is the same as its own model, if so, then execute step S4; if not, then ...

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Abstract

The invention discloses an automatic screen defect testing method based on a POS machine model. The method comprises the steps that S1, a PC terminal is connected with a POS machine to be tested, andthe PC terminal sends an acquisition instruction containing the model information to the POS machine to be tested; S2, the POS machine to be tested receives the acquisition instruction; S3, the POS machine to be tested judges whether the model in the acquisition instruction is the same as the model of the POS machine, and if yes, the step S4 is executed; and if not, matching failure information isfed back to the PC terminal, the PC terminal changes the machine model information according to the information fed back by the POS machine to be tested and generates a new acquisition instruction, and the method returns to the step S2; S4, the POS machine to be tested collects screen pixel point information of the POS machine according to the acquisition instruction, converts the screen pixel point information into an array and transmits the array to the PC terminal; and the like. The method has the advantages that whether the screen pixel points of POS machines of different models are damaged or not can be effectively detected; and the screen pixel point test efficiency can be improved, the manual test careless mistakes are reduced, and the time cost is reduced.

Description

technical field [0001] The invention relates to the technical field of POS machine screen defect testing, in particular to an automatic screen defect testing method based on the POS machine model. Background technique [0002] In order to accurately and completely display the screen information of the POS machine, it is necessary to check the screen pixel damage ratio of each model and each machine. Manual inspection wastes a lot of time, is inefficient, and is prone to errors. Contents of the invention [0003] The purpose of the present invention is to provide a screen defect automatic testing method based on the POS machine model, thereby solving the aforementioned problems in the prior art. [0004] In order to achieve the above object, the technical scheme adopted in the present invention is as follows: [0005] A method for automatic testing of screen defects based on POS machine models, comprising the steps of, [0006] S1. Connect the PC end to the POS machine to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G07G1/12
CPCG01M11/02G07G1/12
Inventor 肖二辉祁兵刘福标卢建兴
Owner AITIWEIER ELECTRONICS TECH BEIJING
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