On-site testing method for reflectivity of curved wave-absorbing material
A microwave absorbing material and field testing technology, which is applied in the direction of material analysis, material analysis, and measurement device using microwave means, which can solve the problems that stealth equipment does not have the harsh measurement environment of the far-field method and cannot be directly measured by the bow method.
Pending Publication Date: 2020-11-13
重庆测威科技有限公司
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[0003] The surface of stealth equipment is mostly a curved surface, which cannot be directly measured by the bow method; the actual use environment of stealth equipment does not have the harsh measurement environment required by the far-field method
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[0023] The present invention will be further described below with reference to the drawings and embodiments. It can be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for ease of description, the drawings only show a part but not all of the content related to the present invention. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention. The terms used in the description of the present invention herein are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more related listed items.
[0024] figure 1 Shows a flow chart of a method for on-site testing of the reflectivity of a curved surfa...
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Abstract
The invention discloses an on-site testing method for the reflectivity of a curved wave-absorbing material. The method comprises the steps of measuring the scattering parameter of a wave-absorbing material on the surface of measured equipment; adhering metal conductive cloth with good reflection performance to the same part of the surface of measured equipment, measuring the scattering parameter after adhesion of the metal conductive cloth, removing the equipment, measuring the scattering parameter of a background, performing data processing according to the obtained three scattering parameters, and calculating to obtain the reflectivity of the wave-absorbing material on the surface of the measured equipment. According to the method for testing the reflectivity of a curved surface wave-absorbing material, the reflectivity of the curved surface wave-absorbing material can be accurately measured, the problem that the reflectivity of the surface wave-absorbing material cannot be measuredon site under the actual use environment condition of equipment is solved, and a basis is provided for on-site measurement and performance evaluation of the wave-absorbing performance of the curved surface wave-absorbing material.
Description
Technical field [0001] The invention relates to the field of measurement and evaluation of the reflectivity of a wave absorbing material, and more specifically, to a field test method for the reflectivity of a curved wave absorbing material. Background technique [0002] In order to achieve the electromagnetic stealth effect of the equipment, the surface of the stealth equipment is coated with a large number of absorbing materials of different labels, specifications and thicknesses. After the stealth equipment is delivered to the user for a period of time, the absorbing material coated on it will inevitably decrease gradually with the increase of use time and the influence of the use environment. The existing national military standards put forward strict requirements on the test environment and test conditions for the performance appraisal and measurement of absorbing materials. The far-field method (in a compact field) or the bow method must be used to perform the performance o...
Claims
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IPC IPC(8): G01N22/00
CPCG01N22/00
Inventor 彭刚薛昀
Owner 重庆测威科技有限公司