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A Rotation Axis Calibration Method Based on Binocular Vision

A calibration method and binocular vision technology, applied in instruments, measuring devices, optical devices, etc., can solve the problems of missing point cloud data, affecting the implementation of reverse engineering, limiting the effect of measurement and reconstructing topography, etc., to ensure the calibration The effect of precision

Active Publication Date: 2022-05-17
NANCHANG HANGKONG UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If a camera is used to complete the measurement, the camera must not only calibrate the parameters of the rotation axis with high precision, but also collect a large number of photos required for the three-dimensional contour reconstruction of the object. The setting angle and pose of the camera greatly limit the measurement of the rotation axis parameters and the reconstruction of the shape. For example, it may cause the loss of point cloud data on the top of the object and the depression, which will affect the implementation of reverse engineering and the analysis of measurement results

Method used

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  • A Rotation Axis Calibration Method Based on Binocular Vision
  • A Rotation Axis Calibration Method Based on Binocular Vision
  • A Rotation Axis Calibration Method Based on Binocular Vision

Examples

Experimental program
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Effect test

Embodiment 1

[0074] In the step S2, when the checkerboard calibration board rotates with the turntable, the calibration camera captures an image of the checkerboard calibration board at every angle of 17.143°, and the rotation table rotates once to collect images of the checkerboard calibration board. 21 images.

Embodiment 2

[0076] The step S4 uses the following formula to calculate the three-dimensional coordinates of the feature points in the calibration camera coordinate system:

[0077]

[0078] Among them, R C is the rotation parameter matrix inside the camera, T C is the internal translation parameter matrix of the camera, (X C , Y C ,Z C ) is the coordinate of the feature point in the camera coordinate system, (X W , Y W ) are the coordinates of feature points in the checkerboard calibration board.

Embodiment 3

[0080] Utilize the coordinates of the same feature point under each rotation angle, described step S5 adopts following formula to obtain the circle center coordinates of circumscribed circle (x 0 ,y 0 ,z 0 ):

[0081]

[0082] in,

[0083] A 1 =y 1 z 2 -y 1 z 3 -z 1 the y 2 +z 1 the y 3 +y 2 z 3 -y 3 z 2 ;

[0084] B 1 =-x 1 z 2 +x 1 z 3 +z 1 x 2 -z 1 x 3 -x 2 z 3 +x 3 z 2 ;

[0085] C 1 =x 1 the y 2 -x 1 the y 3 -y 1 x 2 +y 1 x 3 +x 2 the y 3 -x 3 the y 2 ;

[0086] D. 1 =-x 1 the y 2 z 3 +x 1 the y 3 z 2 +x 2 the y 1 z 3 -x 3 the y 1 z 2 -x 2 the y 3 z 1 +x 3 the y 2 z 1 ;

[0087] A 2 =y 2 z 3 -y 2 z 1 -z 2 the y 3 +z 2 the y 1 +y 3 z 1 -y 1 z 3 ;

[0088] B 2 =-x 2 z 3 +x 2 z 1 +z 2 x 3 -z 2 x 1 -x 3 z 1 +x 1 z 3 ;

[0089] C 2 =x 2 the y 3 -x 2 the y 1 -y 2 x 3 +y 2 x 1 +x 3 the y 1 -x 1 the y 3 ;

[0090] D. 2 =-x 2 the y 3 z 1 +x 2 the y 1 z 3 +x 3 the y ...

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Abstract

The invention discloses a method for calibrating a rotation axis based on binocular vision, and relates to the technical field of rotation measurement. A calibration camera is used to calibrate high-precision rotation axis parameters directly above the turntable. According to the external parameter matrix of the binocular camera, the coordinate system of the camera is calibrated. The rotation axis parameters below are converted to the measurement camera coordinate system, and the measurement camera can reconstruct the three-dimensional shape of the object according to the rotation axis parameters in any pose.

Description

technical field [0001] The invention relates to the technical field of rotation measurement, in particular to a method for calibrating a rotation axis based on binocular vision. Background technique [0002] In recent years, structured light 3D imaging technology has developed rapidly. Rotation measurement technology has been widely used in military, industrial, medical diagnosis and other fields, and the rotation axis parameters need to be calibrated during the rotation measurement process. [0003] The structured light system can only measure one side of the object at a time. In order to obtain the complete spatial geometry and surface texture information of the object, it is usually necessary to measure from different angles of the object, resulting in a rotational scanning method. For the measurement of rotating parts, complete surface information can be obtained by using an additional high-precision rotating platform to rotate the part. The coordinate systems are diff...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/245
CPCG01B11/002G01B11/245
Inventor 夏桂锁叶靖伏燕军祝振敏管炳良
Owner NANCHANG HANGKONG UNIVERSITY