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A stage device for a scanning microscope with a large field of view

A scanning microscope and stage technology, applied in the field of microscopes, can solve the problems of mistakenly encountering the object to be scanned, contaminating the object to be scanned, etc., and achieving the effect of avoiding pollution

Active Publication Date: 2022-05-24
ANHUI TECHN COLLEGE OF MECHANICAL & ELECTRICAL ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the purpose of one or more embodiments of this specification is to propose a stage device for a scanning microscope with a large field of view to solve the problem of placing the object to be scanned under the microscope for scanning or taking it out under the microscope in the prior art. When the object to be scanned, the object to be scanned is exposed, so that the human hand is easy to touch the object to be scanned by mistake, thereby polluting the technical problem of the object to be scanned

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  • A stage device for a scanning microscope with a large field of view
  • A stage device for a scanning microscope with a large field of view
  • A stage device for a scanning microscope with a large field of view

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Embodiment Construction

[0036] In order to make the objectives, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below with reference to specific embodiments.

[0037] It should be noted that, unless otherwise defined, the technical or scientific terms used in one or more embodiments of the present specification shall have the usual meanings understood by those with ordinary skill in the art to which this disclosure belongs. The terms "first," "second," and similar terms used in one or more embodiments of this specification do not denote any order, quantity, or importance, but are merely used to distinguish the various components. "Comprises" or "comprising" and similar words mean that the elements or things appearing before the word encompass the elements or things recited after the word and their equivalents, but do not exclude other elements or things. Words like "connected" or "connected" are not limited to physical o...

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Abstract

The invention provides a stage device for a scanning microscope with a large field of view, which relates to the field of microscopes, and includes a microscope base and a fixed platform, the upper end surface of which is provided with a chute; a driving part and a top block dynamically connected to the driving part; The inner cavity inside the top block, the protective block matching the inner cavity and the placement cavity inside the protective block are provided with side grooves on the two symmetrical side walls of the placement cavity; the rotating shaft corresponding to the side grooves And the rotating drum connected with the rotating shaft key, the two ends of the rotating shaft are connected with the inner wall of the side groove through bearings, and the protection area for placing the object to be scanned is formed between the two rotating drums; the belt connecting the two rotating drums, the belt The upper part is provided with a through hole, and the lower part of the placement cavity is provided with a connecting groove, the connecting groove communicates with the side groove, and the belt passes through the connecting groove; through this device, the human hand will not touch the scanner to be scanned during operation. objects, thus avoiding contamination of the object to be scanned.

Description

technical field [0001] The invention relates to the field of microscopes, in particular to a stage device for a scanning microscope with a large field of view. Background technique [0002] In criminal investigation and forensic identification, high-definition pictures with a large field of view are required. Therefore, in order to quickly obtain clear and complete photos in criminal investigation and forensic identification, it is generally necessary to obtain photos that meet the requirements through a wide-field scanning microscope. . [0003] The present application finds that when the object to be scanned is placed under a microscope for scanning or taken out under a microscope, the object to be scanned is bare, so that human hands are prone to touch the object to be scanned by mistake, thereby contaminating the object to be scanned. SUMMARY OF THE INVENTION [0004] In view of this, the purpose of one or more embodiments of this specification is to provide a stage d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/00G02B21/26G02B21/34
CPCG02B21/002G02B21/26G02B21/34
Inventor 陈俊龚仁乐梁英辉
Owner ANHUI TECHN COLLEGE OF MECHANICAL & ELECTRICAL ENG