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A visual measurement system and measurement method based on multi-attitude with structured light

A technology of visual measurement and measurement method, applied in the field of visual measurement, which can solve the problems of low precision, difficulty in detecting the shape change of the unirradiated area, and limited application, and achieve the effects of improving efficiency, eliminating blind spots of light sources, and high measurement accuracy

Active Publication Date: 2021-05-07
中科元象(常州)智能装备有限公司
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Problems solved by technology

However, this type of method is difficult to detect the shape change of the unirradiated area on the one hand, and the gray value of the product surface cannot be obtained on the other hand, the accuracy is low, and the application is limited

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  • A visual measurement system and measurement method based on multi-attitude with structured light
  • A visual measurement system and measurement method based on multi-attitude with structured light
  • A visual measurement system and measurement method based on multi-attitude with structured light

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Embodiment Construction

[0032] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0033] Such as figure 1 , a three-dimensional vision measurement system based on multi-attitude with structured light, including a delivery platform 3, a CCD camera 1, an optical system with structured light 2 and a computer (not shown in the figure), the delivery platform 3 is used to deliver the Product 4, the CCD camera 1 is used to take a surface image of the product 4 to be tested, and the structured light optical system 2 is used to generate a number of symmetrical images on both sides of the CCD camera 1 at different angles along the moving direction of the product to be tested. The structured light 25 is laid out, and the computer is used...

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Abstract

The present invention provides a three-dimensional vision measurement system and measurement method based on multi-attitude and structured light. The measurement system includes a conveying platform, a CCD camera, an optical system with structured light and a computer. The conveying platform is used to convey products to be tested. The CCD camera is used to take the surface image of the product to be tested, the structured light optical system is used to generate several structured lights arranged symmetrically on both sides of the CCD camera, and the computer is used to receive the images taken by the CCD camera. The measurement method includes installing a CCD camera and an optical system with structured light, making structured light and obtaining a four-dimensional image of the product surface. The three-dimensional visual measurement system based on multi-attitude structured light provided by the present invention can simultaneously eliminate the blind area of ​​the light source when taking pictures by using several structured lights symmetrically arranged on both sides of the CCD camera with multi-angle attitudes to irradiate with light sources at different angles. Obtain a product surface image with clear edges to achieve accurate measurement of the product.

Description

technical field [0001] The invention relates to the technical field of visual measurement, in particular to a visual measurement system and measurement method based on multi-attitude and structured light. Background technique [0002] In the production process of stamping parts, machined parts, plates, etc., in order to ensure product quality, it is usually necessary to visually measure the product to check whether its size is qualified and whether there are other defects. At present, the existing measurement methods generally use multiple line structured light to irradiate the product area, use an area array camera to image, and process the product surface image projected by the line structured light to determine whether the product has defects. Compared with the two-dimensional image method, this method can measure the height of the product and significantly improve the accuracy. However, this type of method is difficult to detect the shape change of the unirradiated area...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24G01N21/892
CPCG01B11/24G01N21/892
Inventor 刘衍
Owner 中科元象(常州)智能装备有限公司
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