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Multi-surface dimension measurement method

A measurement method and surface measurement technology, applied in sorting and other directions, can solve the problems of inability to measure dimensions on multiple sides, low measurement efficiency, and large measurement errors

Inactive Publication Date: 2021-01-29
珠海市科迪电子科技有限公司
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the shortcomings of the above-mentioned prior art, provide a multi-face dimension measurement method, solve the bottleneck problem in the prior art that cannot implement one-time multi-face dimension measurement for the product under test, and overcome the low measurement efficiency, measurement big error problem

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Embodiment 1

[0029] refer to figure 1 , present embodiment 1 provides a kind of multi-face dimension measuring method, comprises the following steps:

[0030] Step S1: Place the first tray containing the tested product on the loader, control the first extraction device to extract at least one tested product, place the tested product on the first test platform, and control the first measuring device to The upper surface of the product under test is measured for the external dimensions;

[0031] Step S2: Control the first extraction device to put the tested product that has passed the upper surface measurement back on the first tray, and control the first tray to transport to the second extraction device;

[0032] Step S3: controlling the second extracting device to extract the product under test, and placing the product under test on the second test platform, and controlling the second measuring device to measure the external dimensions of the side of the product under test;

[0033] Step...

Embodiment 2

[0037] refer to figure 2 , in this embodiment 2, in order to meet the measurement of the lower surface of the product under test, the following measurement method is added in step S3 of the embodiment:

[0038] After the second extraction device picks up the tested product, it first passes through the third measuring device, which is configured to measure the outer dimension of the lower surface of the tested product, wherein the measuring direction of the third measuring device is upward, when the measured After the product is picked up by the second extraction device, its lower surface faces downwards. Therefore, during the movement process, when passing the third measuring device, the third measuring device completes the measurement of the outer dimensions of the lower surface of the three tested products in sequence. There is no need to flip or adjust the angle of the product under test, and the measurement is convenient. After the measurement of the lower surface, the pr...

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Abstract

The invention provides a multi-surface dimension measurement method. Measured products are placed on a first tray, the measurement of the boundary dimension of the upper surfaces and the measurement of the boundary dimension of the side surfaces are automatically and sequentially controlled to be carried out, and the measurement of the boundary dimension of the lower surfaces is carried out beforethe measurement of the boundary dimension of the side surfaces, wherein in the process of the measurement of the boundary dimension of the side surfaces, the measured products are controlled to rotate, and the measurement of the boundary dimension of the side surfaces is carried out on the different side surfaces of the measured products respectively, so that dimension measurement on the six outer surfaces of each measured product is completed, the measurement efficiency is high, and the method is suitable for full inspection work in batch production; and moreover, classified management is carried out on the measured products with different measurement results, material channeling is avoided, and the quality of the products conveyed to the tray on the downstream side is ensured to be consistent.

Description

technical field [0001] The invention belongs to the technical field of electronic product size measurement process, and in particular relates to a multi-face size measurement method. Background technique [0002] In the field of 3C electronic products, it is necessary to measure the outline dimension, slope angle dimension or outer arc dimension of the material in multiple directions, including the top surface, back surface and four sides, and judge the measurement results of each surface, and then improve The quality of production. [0003] As the production quality requirements for such 3C electronic products are getting higher and higher, many products will require dimension measurement on multiple surfaces during production, but the current measurement method is mainly to use two-dimensional and three-dimensional measuring instruments to separate In the method of independent measurement, the measurement for each surface needs to be completed on different measurement equ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/10B07C5/36
CPCB07C5/10B07C5/362
Inventor 吕波
Owner 珠海市科迪电子科技有限公司