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A fault analysis method for cloud native systems based on knowledge graph

A knowledge graph and system fault technology, applied in the field of cloud native system fault analysis based on knowledge graph, can solve the problems of difficulty in locating cloud native systems quickly and accurately, ignoring the interaction between entities, etc.

Active Publication Date: 2022-01-28
SUN YAT SEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] This application provides a cloud-native system fault analysis method based on knowledge graphs, which is used to solve the problem that the existing technology ignores the interaction between entities, and can only locate the faulty entity, making it difficult to quickly and accurately locate the cloud-native system The root cause of the failure is a technical problem

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  • A fault analysis method for cloud native systems based on knowledge graph
  • A fault analysis method for cloud native systems based on knowledge graph
  • A fault analysis method for cloud native systems based on knowledge graph

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Embodiment Construction

[0052] This application provides a cloud-native system fault analysis method based on knowledge graphs, which is used to solve the problem that the existing technology ignores the interaction between entities, and can only locate the faulty entity, making it difficult to quickly and accurately locate the cloud-native system The root cause of the failure is a technical problem.

[0053] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this ap...

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Abstract

This application discloses a fault analysis method for cloud-native systems based on knowledge graphs, including: obtaining original data in cloud-native systems, constructing knowledge graphs based on the original data, and obtaining graph data; performing anomaly detection on graph data through an anomaly detection model , get the abnormal node; calculate the similarity between the abnormal node and the replica node corresponding to the abnormal node, and locate the root cause of the fault based on the similarity, where the replica node corresponding to the abnormal node is the same type of node as the abnormal node. The present application solves the technical problem that the prior art ignores the interaction relationship between entities and can only locate the faulty entity, and it is difficult to quickly and accurately locate the root cause of the fault of the cloud native system.

Description

technical field [0001] The present application relates to the technical field of fault analysis, and in particular to a fault analysis method for cloud-native systems based on knowledge graphs. Background technique [0002] With the development of technologies such as containerization and virtualization, more and more software systems are migrated to the cloud environment, and cloud-native systems have become mainstream solutions for application development and deployment. The cloud-native system is oriented to microservices, and decouples applications into multiple services through container packaging and microservice deployment. However, in this microservice architecture, an application can generate hundreds or even thousands of microservices, and these microservices often have intricate interactions. The huge microservice architecture and massive alarm and indicator data of the cloud native system bring great challenges and pressures to the operation and maintenance work...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F9/455G06F16/36G06K9/62G06N3/04G06N3/08G06V10/74G06V10/82
CPCG06F9/45558G06F16/367G06N3/08G06F2009/45591G06F2009/45595G06N3/045G06F18/22
Inventor 陈鹏飞陈彩琳郑子彬
Owner SUN YAT SEN UNIV