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Topological optimization method for structural defect identification

A topology optimization and structural defect technology, applied in the field of structural defect identification, can solve problems such as complex algorithm steps and many preset parameters, and achieve an intuitive display effect

Active Publication Date: 2021-03-26
CHINA THREE GORGES UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Due to the numerical problems of the level set method itself, certain prior information is required in the identification of structural defects, and the algorithm steps are complicated and there are many preset parameters.

Method used

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  • Topological optimization method for structural defect identification
  • Topological optimization method for structural defect identification
  • Topological optimization method for structural defect identification

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Embodiment 1

[0047] see figure 1 , the present invention provides a topology optimization method for structural defect identification, such as figure 1 As shown, the method includes the following steps:

[0048] S1: Measure the displacement response of the structure with defects at the specified position. The measurement position of the two-dimensional structure can be selected arbitrarily, and the measurement position of the three-dimensional structure is located on the outer surface, but the structural measurement position needs to avoid the structural constraint position and the excitation load application position.

[0049] S2: Establish a 2D / 3D model of the defect-free structure, consider the measurement position point, and establish a finite element model. The nodes of the finite element model of the defect-free structure need to pass through the measurement position point.

[0050] S3: if figure 2 As shown, the design variables are defined on all elements of the finite element mo...

Embodiment 2

[0083] image 3 As shown, according to a preferred embodiment of the present invention, the structure is a two-dimensional beam structure with an aspect ratio of 2:1, only the static displacement response of the structure is considered, all degrees of freedom on the left boundary are constrained, and the midpoint of the right boundary is imposed A vertical downward concentrated load, with displacement response measurement points set on the upper and lower boundaries, and two rectangular defect areas set in the middle, divides the structural domain into 60×30 four-node units. Using the method provided by the present invention to carry out structural defect identification topology optimization, after convergence, the following is obtained: Figure 4 Results shown, where dark areas are defect-free domains and light areas are identified defects.

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Abstract

The invention discloses a topological optimization method for structural defect recognition, and the method comprises the steps: taking the pseudo density of a finite element model unit of a to-be-detected structure as a design variable, taking the square of a displacement response error of the to-be-detected structure and a defect-containing structure as a topological optimization target function, and carrying out the finite element analysis of the structure, so as to obtain a real-time structural displacement response; deriving the derivative of the objective function relative to the designvariable, carrying out topological optimization iterative solution of defect recognition, and completing defect recognition when the objective function converges to the minimum value. Defect identification of the structure is achieved by adopting a topological optimization method, a defect identification problem is converted into an inverse problem to be solved, and the method has a rigorous mathematical theory. According to the invention, positioning and shaping identification of structural defects can be carried out, prior information is not needed, the influence of defect quantity is avoided, and structural defect display is visual.

Description

technical field [0001] The invention belongs to the field of structural defect identification, and more specifically relates to a topology optimization method for structural defect identification. Background technique [0002] Structural defect identification is the technical guarantee for the safe operation of major key mechanical equipment. Its principle is to invert the position and size of structural defects based on the physical response of the structure. The basic idea of ​​structural defect identification is to develop a recognition algorithm based on the physical response of the structure to identify structural defects qualitatively and quantitatively. There are many technologies for non-destructive identification of structural defects, such as ultrasonic detection, radiography and vibration analysis. Ultrasonic detection is one of the important technical means for structural defect identification. Ultrasonic detection requires the user to have rich engineering expe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/23
CPCG06F30/23
Inventor 付君健李帅虎杜义贤田启华周祥曼
Owner CHINA THREE GORGES UNIV
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