The invention discloses a device for calibrating static and dynamic characteristics of a contact
probe type contourgraph sensor. The device comprises a
static displacement performing device, a dynamic displacement performing device and a displacement measuring device, wherein the
static displacement performing device comprises a base, a right bearing seat, left bearing seat, a
ball screw, an oblique block, an x-direction linear guide rail sliding block, a first linear guide rail, a second linear guide rail, a z-direction working table and a z-direction support frame. The oblique block is fixed on the x-direction linear guide rail sliding block, the sliding block is installed on the first linear guide rail, and the first linear guide rail is fixedly connected with the base. The
ball screw penetrates through the center of the oblique block, and two ends of the
ball screw are respectively fixed on the right bearing seat and the left bearing seat. The second linear guide rail is fixed on an
oblique plane of the oblique block. The z-direction working table is connected with the z-direction support frame, and the z-direction support frame is connected with the base. The z-direction working table and the second linear guide rail convert x-direction movement into z-direction movement through sliding friction. The device for calibrating the static and dynamic characteristics of the contact
probe type contourgraph sensor has the advantages of being high in calibrating accuracy, large in calibrating range, high in calibrating speed, simple in structure and low in cost.