Method and system for calibrating reference voltage by using temperature and storage medium
A technology for calibrating reference and reference voltage, which is applied in the direction of control/regulation system, regulation of electrical variables, instruments, etc., to achieve the effect of accurate VREF value, simple calibration process and low cost
Active Publication Date: 2021-03-30
杭州米芯微电子有限公司
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In the actual production process of the chip, due to the fluctuation of the process, the reference voltage of the produced chip must fluctuate, which requires production calibration. The classic method is to use a high-precision voltmeter to measure the reference voltage. In the actual measurement process Among them, the measurement environment is relatively harsh, and a stable voltage for a relatively long period of time is required, and a stable ambient temperature is also required; and sometimes the reference voltage is inside the chip without external pins, so it cannot be used to directly measure the voltage. Measurement
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[0015] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0016] Each chip has an internal reference voltage, which is the temperature sensing voltage △Vbe. At a specific temperature, the temperature-sensing voltage △Vbe of chips produced by different processes changes very little (within ±0.1%), and can be used as a standard voltage measurement point and connected to the analog-to-digital converter ADC inside the chip. The temperature-sensing voltage △Vbe basically does not change with the change of the external power supply voltage, and is only related to the specific temperature. The temperature-sensing voltage △Vbe can be con...
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The invention discloses a method and system for calibrating reference voltage by using temperature and a storage medium, and belongs to the technical field of calibration methods. The method comprisesthe steps of: obtaining a temperature reference TREF, a temperature sensing voltage delta VbeTREF under the temperature reference TREF, and a reference ADC voltage value VADCTREF; measuring the temperature sensing voltage delta VbeT at the current temperature T by using an analog-to-digital converter ADC to obtain a measured ADC voltage value VADCT, and calculating the current temperature T according to the measured ADC voltage value VADCT, the temperature reference TREF and the reference ADC voltage value VADCTREF through a formula that T=VADCT*TREF / VADCTREF; according to the temperature sensing voltage delta VbeTREF under the temperature reference TREF and the current temperature T, obtaining the temperature sensing voltage delta VbeT under the current temperature T through calculation,and finally calculating the value of the reference voltage VREF. The method and system have the advantages of no need for special requirements for the environment temperature, relatively accurate reference voltage VREF value, simple and convenient reference voltage calibration process and low cost.
Description
【Technical field】 [0001] The invention relates to the technical field of chips, in particular to a method, system and storage medium for calibrating a reference voltage by using temperature. 【Background technique】 [0002] In many applications, a relatively accurate voltage or current reference, such as the reference of an analog-to-digital converter ADC, is required. In the actual production process of the chip, due to the fluctuation of the process, the reference voltage of the produced chip must fluctuate, which requires production calibration. The classic method is to use a high-precision voltmeter to measure the reference voltage. In the actual measurement process Among them, the measurement environment is relatively harsh, and a stable voltage for a relatively long period of time is required, and a stable ambient temperature is also required; and sometimes the reference voltage is inside the chip without external pins, so it cannot be used to directly measure the volta...
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CPCG05F1/567
Inventor 杨宏吕尧明黄海程飞吴清源
Owner 杭州米芯微电子有限公司