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Method, system and storage medium for calibrating reference voltage by temperature

A technology for calibrating reference and reference voltage, applied in control/regulation systems, regulating electrical variables, instruments, etc., to achieve the effects of low cost, simple calibration process, and accurate VREF value

Active Publication Date: 2022-04-19
杭州米芯微电子有限公司
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Problems solved by technology

In the actual production process of the chip, due to the fluctuation of the process, the reference voltage of the produced chip must fluctuate, which requires production calibration. The classic method is to use a high-precision voltmeter to measure the reference voltage. In the actual measurement process Among them, the measurement environment is relatively harsh, and a stable voltage for a relatively long period of time is required, and a stable ambient temperature is also required; and sometimes the reference voltage is inside the chip without external pins, so it cannot be used to directly measure the voltage. Measurement

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  • Method, system and storage medium for calibrating reference voltage by temperature

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Embodiment Construction

[0015] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0016] Each chip has an internal reference voltage, which is the temperature sensing voltage △Vbe. At a specific temperature, the temperature-sensing voltage △Vbe of chips produced by different processes changes very little (within ±0.1%), and can be used as a standard voltage measurement point and connected to the analog-to-digital converter ADC inside the chip. The temperature-sensing voltage △Vbe basically does not change with the change of the external power supply voltage, and is only related to the specific temperature. The temperature-sensing voltage △Vbe can be con...

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Abstract

The invention discloses a method, system and storage medium for calibrating a reference voltage by using temperature, and relates to the technical field of calibration methods, wherein the method includes obtaining a temperature reference T REF , temperature reference T REF Temperature sensing voltage △Vbe TREF , Reference ADC voltage value VADC TREF ; Use the analog-to-digital converter ADC to measure the temperature-sensing voltage △Vbe at the current temperature T T , get the measured ADC voltage value VADC T , according to the measured ADC voltage value VADC T , temperature reference T REF , Reference ADC voltage value VADC TREF Through the formula: T=VADC T *T REF / VADC TREF , calculate the current temperature T; according to the temperature reference T REF Temperature sensing voltage △Vbe TREF , the current temperature T, calculate the temperature-sensing voltage △Vbe at the current temperature T T , and finally calculate the value of the reference voltage VREF, the present invention has the advantages of not requiring special requirements on the ambient temperature, the obtained reference voltage VREF value is relatively accurate, the reference voltage calibration process is relatively simple, and the cost is low.

Description

【Technical field】 [0001] The invention relates to the technical field of chips, in particular to a method, system and storage medium for calibrating a reference voltage by using temperature. 【Background technique】 [0002] In many applications, a relatively accurate voltage or current reference, such as the reference of an analog-to-digital converter ADC, is required. In the actual production process of the chip, due to the fluctuation of the process, the reference voltage of the produced chip must fluctuate, which requires production calibration. The classic method is to use a high-precision voltmeter to measure the reference voltage. In the actual measurement process Among them, the measurement environment is relatively harsh, and a stable voltage for a relatively long period of time is required, and a stable ambient temperature is also required; and sometimes the reference voltage is inside the chip without external pins, so it cannot be used to directly measure the volta...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05F1/567
CPCG05F1/567
Inventor 杨宏吕尧明黄海程飞吴清源
Owner 杭州米芯微电子有限公司