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One-to-multiple sorting device of integrated circuit test sorting machine

A technology for testing sorting machines and integrated circuits, which can be used in sorting and other directions to solve problems such as low work efficiency and insufficient classification.

Pending Publication Date: 2021-04-20
FUZHOU PALIDE ELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The integrated circuit testing and sorting machine can complete integrated circuit detection, classification and taping work; the current classification device on the integrated circuit testing and sorting machine can only divide integrated circuits into two categories, that is, qualified and unqualified classification, and the classification is not comprehensive enough
At the same time, most of the classification agencies that classify integrated circuits use the method of grabbing, and the work efficiency is low

Method used

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  • One-to-multiple sorting device of integrated circuit test sorting machine
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  • One-to-multiple sorting device of integrated circuit test sorting machine

Examples

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Embodiment Construction

[0024] like Figure 1~9 As shown, a sorting device for an integrated circuit test sorter includes a material distribution chamber 100, and the top of the material distribution chamber 100 is provided with a material receiving seat 200, and a material receiving hole is opened on the material receiving seat 200 210, below the material receiving seat 200, there is a material distribution seat 300 for distributing materials through rotation, the upper end of the material distribution seat 300 is provided with a feed hole 310 aligned with the material receiving hole 210, and the lower end of the material distribution seat 300 is provided with Off-center discharge hole 320, the inside of the material distribution seat 300 is provided with a channel 330 connecting the feed hole and the discharge hole; the support plate 400 supporting the material distribution seat is provided below the material distribution seat 300, and the lower end of the material distribution seat There is a prot...

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Abstract

The invention relates to a one-to-multiple sorting device and method for an integrated circuit test sorting machine. The one-to-multiple sorting device comprises a material sorting chamber, the top of the material sorting chamber is provided with a material receiving seat, the material receiving seat is provided with a material receiving hole, the lower part of the material receiving seat is provided with a material sorting seat for sorting materials through rotation, the upper end of the material sorting seat is provided with a feeding hole aligned with the material receiving hole, a discharging hole deviating from the center is formed in the lower end of the material sorting seat, a channel for communicating the feeding hole with the discharging hole is formed in the material sorting seat, a supporting plate for supporting the material sorting seat is arranged below the material sorting seat, a plurality of material passing holes which are distributed along the circumference and are in butt joint with the discharging hole through rotation of the material sorting seat in a one-to-one mode are formed in the supporting plate, and a plurality of material receiving boxes corresponding to the material passing holes in an up-and-down one-to-one mode are arranged below the supporting plate. The one-to-multiple sorting device is reasonable in design, convenient to use, high in practicability, capable of sorting in a one-to-multiple mode, high in working efficiency, compact in structure, small in size and small in occupied space.

Description

technical field [0001] The invention relates to a one-point multiple-way sorting device and method for an integrated circuit test sorter. Background technique [0002] The integrated circuit testing and sorting machine can complete integrated circuit detection, classification and taping work; the current classification device on the integrated circuit testing and sorting machine can only divide integrated circuits into two categories, that is, qualified and unqualified classification, and the classification is not comprehensive enough . At the same time, most of the classification agencies that classify integrated circuits use the method of grabbing, and the work efficiency is low. Contents of the invention [0003] In view of this, the object of the present invention is to provide a sorting device and method for one-point-multiple-way classification of integrated circuit test sorting machines with high work efficiency. [0004] The present invention is realized by the f...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/02B07C5/34B07C5/36B07C5/38
Inventor 吴成君林强
Owner FUZHOU PALIDE ELECTRONICS TECH
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